MOEMS for prospective space applications

Thierry Viard; Christophe Buisset; Frederic Zamkotsian; Vincent Costes; Luis Venancio

doi:10.1117/12.874665

18 February 2011 MOEMS for prospective space applications

Thierry Viard, Christophe Buisset, Frederic Zamkotsian, Vincent Costes, Luis Venancio

Proceedings Volume 7928, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X; 79280I (2011) https://doi.org/10.1117/12.874665
Event: SPIE MOEMS-MEMS, 2011, San Francisco, California, United States

Abstract

We are involved with ESA and CNES since several years, in the analysis of space applications using MOEMS components. A first concept using a Programmable Micro Diffracting Device (PMDG) has been proposed for an astronomical spectrometer with a small field of view. In this application the introduction of a MOEMS component has allowed to reduce the focal plane complexity (one mono detector) and to increase the mission adaptability to the target (programmable mission). An opto mechanical concept has been proposed and first performance assessed. A second concept has been studied and deals with the use of a MOEMS component to realize an innovative spectrometer, so-called convolution spectrometer. In the proposed solution, a MOEMS is used to realize a shifting spectral window (large spectral width) associated to a slight spectral increment. The signal given by the detector being the convolution between the target spectral density and the spectral window, it is then possible to recover the target spectral signal by a deconvolution. A breadboard has been developed, and the concept of the convolution spectrometer has been successfully demonstrated. Finally, some results of analysis will be also given concerning the use of a DMD for Earth observation associated to a push broom detection mode and a large field of view.

Citation Download Citation

Thierry Viard, Christophe Buisset, Frederic Zamkotsian, Vincent Costes, and Luis Venancio "MOEMS for prospective space applications", Proc. SPIE 7928, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X, 79280I (18 February 2011); https://doi.org/10.1117/12.874665

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