Silicon single crystal as back-reflector for high-intensity hard x-rays

Tom Pardini; Sébastien Boutet; Joseph Bradley; Tilo Doeppner; Luke B. Fletcher; Dennis F. Gardner Jr.; Randy M. Hill; Mark S. Hunter; Jacek Krzywinski; Marc Messerschmidt; Arthur E. Pak; Florian Quirin; Klaus Sokolowski-Tinten; Garth J. Williams; Stefan P. Hau-Riege

doi:10.1117/12.2061087

8 October 2014 Silicon single crystal as back-reflector for high-intensity hard x-rays

Tom Pardini, Sébastien Boutet, Joseph Bradley, Tilo Doeppner, Luke B. Fletcher, Dennis F. Gardner Jr., Randy M. Hill, Mark S. Hunter, Jacek Krzywinski, Marc Messerschmidt, Arthur E. Pak, Florian Quirin, Klaus Sokolowski-Tinten, Garth J. Williams, Stefan P. Hau-Riege

Author Affiliations +

Proceedings Volume 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II; 92100D (2014) https://doi.org/10.1117/12.2061087
Event: SPIE Optical Engineering + Applications, 2014, San Diego, California, United States

Abstract

At the Lawrence Livermore National Laboratory (LLNL) we have engineered a silicon prototype sample that can be used to reflect focused hard x-ray photons at high intensities in back-scattering geometry.1 Our work is motivated by the need for an all-x-ray pump-and-probe capability at X-ray Free Electron Lasers (XFELs) such as the Linac Coherent Light Source (LCSL) at SLAC. In the first phase of our project, we exposed silicon single crystal to the LCLS beam, and quantitatively studied the x-ray induced damage as a function of x-ray fluence. The damage we observed is extensive at fluences typical of pump-and-probe experiments. The conclusions drawn from our data allowed us to design and manufacture a silicon mirror that can limit the local damage, and reflect the incident beam before its single crystal structure is destroyed. In the second phase of this project we tested this prototype back-reflector at the LCLS. Preliminary results suggest that the new mirror geometry yields reproducible Bragg reflectivity at high x-ray fluences, promising a path forward for silicon single crystals as x-ray back-reflectors.

Citation Download Citation

Tom Pardini, Sébastien Boutet, Joseph Bradley, Tilo Doeppner, Luke B. Fletcher, Dennis F. Gardner Jr., Randy M. Hill, Mark S. Hunter, Jacek Krzywinski, Marc Messerschmidt, Arthur E. Pak, Florian Quirin, Klaus Sokolowski-Tinten, Garth J. Williams, and Stefan P. Hau-Riege "Silicon single crystal as back-reflector for high-intensity hard x-rays", Proc. SPIE 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II, 92100D (8 October 2014); https://doi.org/10.1117/12.2061087

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
6 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Silicon

Crystals

X-rays

Hard x-rays

Liquid crystal lasers

Diodes

Mirrors

Show All Keywords

Keywords/Phrases

Search In:

Publication Years