Paper
6 March 2015 A vertical scanning positioning system with large range and nanometer resolution for optical profiler
Author Affiliations +
Proceedings Volume 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation; 94463C (2015) https://doi.org/10.1117/12.2181351
Event: International Symposium on Precision Engineering Measurement and Instrumentation, 2014, Changsha/Zhangjiajie, China
Abstract
Piezoelectric ceramics with a flexible hinge guide was used for fine positioning at nanometer level, while a stepping motor was used for coarse positioning with a resolution at micrometer level, and their combination helped fulfillment of vertical scanning positioning with large range and nanometer resolution. A grating sensor was used for the real-time measurement of scanning displacement for close-loop positioning control. The properties of the flexible hinge guide was analyzed using ANSYS. Experimental results indicated the performance of the system was good. The system had a good application prospect in an optical profiler for surface measurement.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qian Li, Xiaojun Liu, Zili Lei, Yi Zheng, Liangzhou Chen, and Wenlong Lu "A vertical scanning positioning system with large range and nanometer resolution for optical profiler", Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94463C (6 March 2015); https://doi.org/10.1117/12.2181351
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Ceramics

Optical scanning systems

Sensors

Optical resolution

Beam splitters

Ferroelectric materials

Diffraction gratings

RELATED CONTENT


Back to Top