Another problem that mainly affects thin films below about 2 μm arises if one uses measuring heads collimators or even microscope headers to obtain high lateral resolutions in the thickness determination. The use of a header introduces angles of incidence different from the default angle α = 0° in reflectometry. Then, the measured reflectance becomes polarization-dependent and the angle must be explicitly considered in the evaluation algorithm. For a microscope header however, all angles between 0° and the angle of aperture must be considered. We will present a solution that allows to reduce the work for each header on taking into account the polarization of the reflected light and a corresponding effective angle αeff. |
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CITATIONS
Cited by 3 scholarly publications.
Reflectivity
Microscopes
Thin films
Refractive index
Head
Polarization
Fourier transforms