Paper
26 August 2015 Multilayer optics for monochromatic high-resolution x-ray imaging mircoscopes
Ph. Troussel, A. Do, D. Gontier, D. Dennetiere, P. Høghøj, S. Hedacq
Author Affiliations +
Abstract
Within the framework of its researches on Inertial Confinement Fusion (ICF), the “Commissariat à l’Énergie Atomique et aux Énergies Alternatives” (CEA) studies and designs advanced X-ray diagnostics in order to probe dense plasmas produced by Laser facilities. The final goal for those diagnostics is to be used during experiments on the Laser Megajoules french facility (LMJ) at Bordeaux.

We present two types of advanced monochromatic High Resolution X-ray Imaging microscopes (HRXI) who have high spatial resolution capability (3-6 μm) and high efficiency.

The first microscope so-called MERSSIX consists of two toroïdals mirrors mounted into a Wolter type geometry and working at grazing incidence. Non-periodic multilayer (depth graded) mirrors were developed with special coatings designed to provide broadband X-ray reflectance in the 1 - 22 keV energy range. Associated to this Wolter microscope a potential monochromatic third mirror coated with a multilayer stack can be used for monochromatic application in that range.

The second microscope is composed of a transmission gold Fresnel Phase Zone Plate (FPZP) and a narrow bandwidth multilayer mirror. We present an experimental study with X-ray plasma-source and a complete characterization of the X-ray optics on the synchrotron radiation facility BESSY II.

Potentialities (a few μspatial resolution monochromatic images) and complementarity of these two monochromatic HRXI are discussed. The design of the MLs for each microscope is detailed.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ph. Troussel, A. Do, D. Gontier, D. Dennetiere, P. Høghøj, and S. Hedacq "Multilayer optics for monochromatic high-resolution x-ray imaging mircoscopes", Proc. SPIE 9588, Advances in X-Ray/EUV Optics and Components X, 958805 (26 August 2015); https://doi.org/10.1117/12.2188185
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KEYWORDS
Mirrors

Microscopes

X-ray imaging

Reflectivity

Multilayers

X-rays

Spatial resolution

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