Paper
23 September 2015 Volume phase elements in chalcogenide (Ge33As12Se55) thin films
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Abstract
Recording of binary volumetric diffractive optical elements within a 13 μm thick photosensitive chalcogenide layer using an innovative exposure set-up based on digital micro-mirrors devices is demonstrated. Different examples of beam transformations are shown such as the conversion of Gaussian beam into higher order modes or top-hat beam shapers.
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Alexandre Joërg, Michel Lequime, and Julien Lumeau "Volume phase elements in chalcogenide (Ge33As12Se55) thin films", Proc. SPIE 9627, Optical Systems Design 2015: Advances in Optical Thin Films V, 96271F (23 September 2015); https://doi.org/10.1117/12.2191372
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KEYWORDS
Refractive index

Diffractive optical elements

Chalcogenides

Diffraction

Binary data

Gaussian beams

Digital micromirror devices

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