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Alexandre Joerg
at Institut Fresnel
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Publications (1)
Proceedings Article | 23 September 2015 Paper
Volume phase elements in chalcogenide (Ge33As12Se55) thin films
Proceedings Volume 9627, 96271F (2015) https://doi.org/10.1117/12.2191372
KEYWORDS: Refractive index, Diffractive optical elements, Chalcogenides, Diffraction, Binary data, Gaussian beams, Digital micromirror devices, Thin films, Semiconductor lasers, Beam shaping
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