1 September 1999 Nondestructive assessment of thinning of plates using digital shearography
Rajpal S. Sirohi, Cho Jui Tay, Huai Min Shang, W. P. Boo
Author Affiliations +
A novel method of estimating the remaining thickness of a defective plate having the form of localized thinning using digital shearography, based on a simple relationship between the curvature of the deflected defect and the defect geometry is presented.
Rajpal S. Sirohi, Cho Jui Tay, Huai Min Shang, and W. P. Boo "Nondestructive assessment of thinning of plates using digital shearography," Optical Engineering 38(9), (1 September 1999). https://doi.org/10.1117/1.602210
Published: 1 September 1999
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Cited by 25 scholarly publications.
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KEYWORDS
Nondestructive evaluation

Shearography

Interferometry

Aluminum

Charge-coupled devices

Fringe analysis

Optical engineering

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