Dr. Adam Czyzewski
at Institute of Applied Optics
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 1 October 2018 Paper
Dariusz Litwin, Tadeusz Kryszczyński, Adam Czyżewski, Jerzy Mikucki, Jacek Galas, Marek Daszkiewicz
Proceedings Volume 10808, 108080B (2018) https://doi.org/10.1117/12.2500295
KEYWORDS: Sensors, Confocal microscopy, Colorimetry, Light sources, Objectives, Mirrors, Spectroscopy, Chemical species, Optical inspection, Chromatic aberrations

Proceedings Article | 7 August 2017 Paper
Jacek Galas, Dariusz Litwin, Marek Wychowaniec, Marek Daszkiewicz, Kamil Radziak, Tomasz Kozłowski, Adam Czyżewski, Jarosław Młyńczak, Krzysztof Kopczyński, Jarosław Kisielewski, Ryszard Stępień, Stefan Sitarek
Proceedings Volume 10445, 1044503 (2017) https://doi.org/10.1117/12.2280320
KEYWORDS: Laser scattering, Tomography, Infrared lasers, Scattering, Opacity, Infrared spectroscopy, Spectroscopy, Light scattering, Cameras, Gallium arsenide, Crystals, Infrared cameras, Visualization, Semiconductor materials, Laser crystals

Proceedings Article | 23 December 2016 Paper
Dariusz Litwin, Jacek Galas, Adam Czyżewski, Barbara Rymsza, Leszek Kornalewski, Tadeusz Kryszczyński, Jerzy Mikucki, Piotr Wikliński, Marek Daszkiewicz, Jacek Malasek
Proceedings Volume 10142, 1014214 (2016) https://doi.org/10.1117/12.2263235
KEYWORDS: Roads, Light emitting diodes, Photonics, Safety, Confocal microscopy, Projection systems, Optical components, Visibility, Light sources, Bridges

Proceedings Article | 16 May 2007 Paper
Proceedings Volume 6585, 65851R (2007) https://doi.org/10.1117/12.722858
KEYWORDS: Sensors, Mirrors, Optoelectronics, Absorption spectroscopy, Semiconductor lasers, Absorption, Signal detection, Reflectivity, Control systems, Optical resonators

Proceedings Article | 24 September 2005 Paper
Proceedings Volume 5959, 59590U (2005) https://doi.org/10.1117/12.622825
KEYWORDS: Microscopes, In vitro testing, Image processing, CCD cameras, Motion analysis, Visualization, Phase contrast, Statistical analysis, Data acquisition, Error analysis

Showing 5 of 6 publications
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