The analytical expressions for the difference between the classical frequency of the parametric X-ray radiation (PXR)
and the Bragg frequency in the PXR reflection are derived. The difference increases proportionally to the square of the
angular distance to the PXR reflection center and also the Bragg frequency always exceeds the PXR one from the same
system of crystallographic planes. A possibility of the existence of PXR diffraction from electrons of moderate energy to
forward direction due to PXR peak broadening in a thin crystal and also in polycrystal or mosaic crystal is described. The
experiment at accelerator for observation of PXR diffracted to forward direction in textured polycrystal or mosaic crystal
is proposed. Application of PXR spectral peak broadening for measurement of thin crystal thickness, crystalline grains or
domains size is proposed.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.