Mr. Alexandre Fong Profile

Alexandre Fong

Vice President Of Engineering at HinaLea Imaging

SPIE Involvement:

Author | Instructor

Area of Expertise:

Hyperspectral Imaging , Photometry and Radiometry , Displays , LEDs , Lidar , Aerospace

Websites:

Personal Website | Company Website

Photonics, optical-mechanical hardware and systems design, engineering and integration.
- Data science, software engineering and algorithm development (i.e. Python, C, R, etc.)
- Life sciences, imaging, test and measurement instrumentation, aerospace systems and electronic components.
- Experienced strategic, general, sales and marketing management and technical product and business development professional.

- US citizen with international experience, eligible for security clearance.
- Proven successful track record in program management, operations, business development, OEM/B2B sales, marketing, public relations, communications and finance and public policy.

Proceedings Article | 31 May 2022 Presentation + Paper

Classification of chemical species for nuclear reactor inspections using SWIR hyperspectral imaging

Alexandre Fong, George Shu, Bruce Greer, Nicholas Brummitt

Proceedings Volume 12094, 120940J (2022) https://doi.org/10.1117/12.2617323

KEYWORDS: Hyperspectral imaging, Chemical species, Sodium, Short wave infrared radiation, Cameras, Inspection, Fabry–Perot interferometers, Corrosion, Chemical analysis, Data modeling

Read Abstract +

Proceedings Article | 12 April 2021 Presentation + Paper

Measurement of alfatoxin in maize/corn meal and other agricultural products

Alexandre Fong, George Shu

Proceedings Volume 11727, 1172714 (2021) https://doi.org/10.1117/12.2588282

KEYWORDS: Agriculture, Spectroscopes, Liver, Kidney, Hyperspectral imaging, Heart, Fungi, Endocrine system, Contamination, Chromatography

Read Abstract +

Proceedings Article | 4 October 2020 Presentation + Paper

Detecting foodborne pathogens with darkfield hyperspectral microscopy

Alexandre Fong, George Shu, Barry McDonogh, Bosoon Park

Proceedings Volume 11576, 115760C (2020) https://doi.org/10.1117/12.2584913

Read Abstract +

Proceedings Article | 11 February 2011 Paper

Spectral transmittance and reflectance measurements utilizing a DLP based spectral source

Alexandre Fong

Proceedings Volume 7932, 79320J (2011) https://doi.org/10.1117/12.877087

KEYWORDS: Reflectivity, Transmittance, Diffuse reflectance spectroscopy, Translucency, Optical filters, Sensors, Light sources, Integrating spheres, Digital micromirror devices, Digital Light Processing

Read Abstract +

Proceedings Article | 18 February 2010 Paper

Application of digital micromirror devices for spectral-response characterization of solar cells and photovoltaics

Alexandre Fong

Proceedings Volume 7596, 75960I (2010) https://doi.org/10.1117/12.846122

KEYWORDS: Solar cells, Light sources, Light, Digital micromirror devices, Photovoltaics, Modulation, Solar energy, Monochromators, Sun, Sensors

Read Abstract +

Proceedings Article | 14 February 2009 Paper

Application of digital micromirror devices to vision science: shaping the spectrum of stimuli

Michael Crognale, Michael Webster, Alexandre Fong

Proceedings Volume 7210, 721005 (2009) https://doi.org/10.1117/12.810201

KEYWORDS: Color vision, Digital Light Processing, Light, Digital micromirror devices, Light sources, LCDs, Visual system, Modulation, Visual process modeling, Visible radiation

Read Abstract +

Proceedings Article | 3 July 1998 Paper

Rapid digital elevation data capture using airborne scanning lasers: recent projects in the U.S.A., Europe, and South Africa

Alexandre Fong, Bill Gutelius, Don Carswell

Proceedings Volume 3382, (1998) https://doi.org/10.1117/12.312628

KEYWORDS: Airborne laser technology, Global Positioning System, Laser systems engineering, Laser applications, Vegetation, Laser scanners, 3D scanning, Pulsed laser operation, Photogrammetry, LIDAR

Read Abstract +

Showing 5 of 7 publications

Course Instructor

SC657: Accurate Measurement of LED Optical Properties

This course provides attendees with a working knowledge of the optical properties of LEDs and how to measure them correctly. The course concentrates on techniques for controlling variables that can lead to large errors. Traceability to NIST and uncertainty are explained clearly. Many practical examples are included throughout, including actual measurements of die and packaged LEDs. Attendees will be able to identify and control critical variables to give high accuracy measurements.

Expand Description +

Keywords/Phrases

Search In:

Publication Years