Dr. Arunachalam Narayanaperumal
Assistant Professor at Indian Institute of Technology Madras
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 March 2017 Paper
Sudhanva Bhat, Sreedath Panat, Arunachalam N
Proceedings Volume 10341, 1034126 (2017) https://doi.org/10.1117/12.2268802
KEYWORDS: Image classification, Image processing, Machine vision, Inspection, Image filtering, Image analysis, Image enhancement, Binary data, Feature extraction, Image acquisition

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