Dr. Ashit Talukder
Head of Artificial Intelligence and Machine Learning at Moody's Analytics
SPIE Involvement:
Author
Publications (32)

Proceedings Article | 1 May 2017 Paper
Proceedings Volume 10203, 102030O (2017) https://doi.org/10.1117/12.2277737
KEYWORDS: Infrared imaging, Weapons, Databases, Thermography, Video, Infrared detectors, Infrared radiation, Video surveillance, Feature extraction, Motion models

Proceedings Article | 27 April 2010 Paper
Ken Cooper, Robert Dengler, Nuria Llombart, Ashit Talukder, Anand Panangadan, Chris Peay, Imran Mehdi, Peter Siegel
Proceedings Volume 7671, 76710Y (2010) https://doi.org/10.1117/12.850395
KEYWORDS: Radar, Terahertz radiation, Radar imaging, Beam shaping, Signal to noise ratio, Signal processing, Imaging systems, Mirrors, Reflectors, Signal attenuation

Proceedings Article | 5 May 2009 Paper
Proceedings Volume 7333, 73330V (2009) https://doi.org/10.1117/12.820509
KEYWORDS: Sensors, Sensor networks, Control systems, Environmental sensing, Data modeling, Systems modeling, Sensing systems, Optimization (mathematics), Environmental monitoring, Process modeling

Proceedings Article | 13 April 2009 Paper
Proceedings Volume 7340, 73400D (2009) https://doi.org/10.1117/12.820488
KEYWORDS: Satellites, Sensors, Code division multiplexing, Motion models, Data fusion, Temporal resolution, Filtering (signal processing), Mining, Data mining, Data modeling

Proceedings Article | 17 March 2008 Paper
Ashit Talukder, Anand Panangadan
Proceedings Volume 6977, 69770Q (2008) https://doi.org/10.1117/12.785897
KEYWORDS: Sensors, Sensor networks, Control systems, Systems modeling, Process modeling, Environmental monitoring, Device simulation, Environmental sensing, Computer programming, Wireless communications

Showing 5 of 32 publications
Conference Committee Involvement (17)
Pattern Recognition and Tracking XXXI
27 April 2020 | Online Only, California, United States
Pattern Recognition and Tracking XXX
15 April 2019 | Baltimore, MD, United States
Pattern Recognition and Tracking XXIX
18 April 2018 | Orlando, FL, United States
Pattern Recognition and Tracking XXVIII
12 April 2017 | Anaheim, CA, United States
Optical Pattern Recognition XXVII
20 April 2016 | Baltimore, MD, United States
Showing 5 of 17 Conference Committees
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