Infrared imaging detection technology has been widely used. In the process of using infrared images for target observation, a large amount of typical target infrared radiation characteristic data is needed as infrared reference information to eliminate interference factors such as environment, time period, and false targets to achieve accurate target identification. The acquisition of typical target infrared radiation characteristic data is to use infrared characteristic measurement equipment to accurately measure the measured target under various external environments and conditions, and finally form the available target infrared radiation characteristic data through data analysis and arrangement. Since infrared target characteristic data needs to be acquired in the field, these devices generally have the characteristics of working environment in the field environment, multiple types of measurement targets, long measurement distance and wide measurement space. Therefore, in order to eliminate the influence of external environmental factors and accurately obtain the infrared characteristics of the target, it is necessary to calibrate the key parameters of the large-aperture infrared characteristics measurement equipment on the test site. However, there is currently no field calibration capability for large-aperture infrared characteristic measurement equipment, which has a negative impact on the application of infrared imaging detection systems. In order to solve the above problems, this paper develops a large-aperture long-focus optical system in an external field environment, which mainly includes a high-temperature standard infrared radiation source, a large-aperture off-axis primary mirror, a secondary mirror, and a target. After the development was completed, it was applied in the external field environment to calibrate a certain high-resolution infrared characteristic measurement equipment, and the relevant data were analyzed. The analysis results show that the uniformity measurement uncertainty is better than 0.4K (k=2), the distortion measurement uncertainty is better than 1% (k=2). And a good application effect is achieved.
Laser screen velocity measurement system is widely used due to its real-time, non-contact, repeatability and high-precision measurement. This paper proposes a circular arc cylinder reflective laser screen velocity measuring method. The first step is to build and deduce the mathematical model of circular cylindrical reflective laser screen velocity measurement system, on this basis, the aberration formula of the optical system is calculated; and the mathematical expression of the theoretical light power density distribution in the effective laser screen area is obtained; optical simulation of the system is performed with Zemax, the photoelectric detection receives a narrow light spot with a diameter of 1.22mm , the result is similar to the theoretical aberration formula; the 7.62mm projectile is respectively passed through different areas of the light screen, calculating the difference value between that’s light power and the light power of the detector when no projectile passes through the light screen, obtaining the system signal sensitivity distribution, the results show that the light power density of the central superimposed region is higher than that of the two sides and decreases with the increase of the y coordinate, moreover, it jumps at the intersection of regions; the maximum variation of light power is 0.19mW , and the minimum is 9.9μW , the effective target surface utilization rate is 93.75% . The construction of the system provides a reliable basis for the design of velocity measurement target for large caliber projectile and another method for realizing velocity measurement of large range trajectory dispersion.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.