The process water of the petrochemical industry contains particles and oil droplets which need to be removed by the water treatment process before the water can safely be reinjected into the well. For the detection and analysis of the particles and oil droplets a particle analysis system based on hyperspectral imaging, fluorescence imaging and white-light imaging has been developed. The particle and droplet size range for this application varies from 5 µm to 150 µm. Currently used particle analyzers use monochrome cameras with backlight illumination. The thereby obtained monochromatic image is used to derive shape and size of the particles and droplets, but no chemical information. The shape information is used to differentiate between solid particles and oil droplets. The solid particles appear black in the images and therefore a more detailed analysis of their material is not possible. The combination of different imaging systems presented in this work allow for a more detailed and robust analysis of the particles and oil droplets in the process water. The fluorescence imaging system is used for a reliable detection of the oil droplets. The white-light imaging system and hyperspectral imaging system acquire high quality color information of particles and oil droplets. This information is vital for the process water treatment during oil production. An ultrasound particle manipulation system is used to guide the particles and oil droplets into the focal plane of the imaging systems. The alpha version of the particle analysis system and the initial results of measurements on solid particles and oil droplets in aqueous suspension are presented.
Silicon-glass microcavities have been widely used as a functional packaging method for many applications since its founding. During the process, sodium ion (Na+) gains mobility due to the high temperature and moves towards the cathode, where it receives an electron and further moves outside the glass, forming metal liquid at the glass/cathode interface, since the melting point of Na is 97.79 ºC. Naturally, a part of Na will stay at the cathode after the wafer is removed, and, without a proper cleaning, it accumulates. This allows liquid Na droplets to be blown inside the silicon/glass interface with a gas flow at the later bonding process, which can strongly influence the sensitive silicon elements. Standard methods such as Raman or mass spectroscopy are not appropriate for this application, because the contamination is either not detectable or the cavity will be destroyed. In this study, we experimentally analyzed the closed system using laser induced breakdown spectroscopy (LIBS). With a high-intensity laser, a gas breakdown was generated inside the cavity and measured via optical emission spectrum. The study was performed in two steps: first, the minimal dimension of the cavity was determined in order to not damage the walls; second, the system was fabricated according to the results from last step, and the measurement concept was proved.
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