Caroline Bossuyt
at Univ of Antwerp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 October 2022 Presentation + Paper
C. Bossuyt, J. De Beenhouwer, J. Sijbers
Proceedings Volume 12242, 1224219 (2022) https://doi.org/10.1117/12.2633523
KEYWORDS: X-rays, X-ray sources, Inspection, X-ray imaging, X-ray computed tomography, Image quality, X-ray technology, Radiography, CT reconstruction

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