Dr. Chan Kyeong Hyon
at AIST
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 28 February 2006 Paper
M. Maeda, T. Kamimura, C. Hyon, K. Matsumoto
Proceedings Volume 6127, 612713 (2006) https://doi.org/10.1117/12.647024
KEYWORDS: Electrodes, Field effect transistors, Electrical breakdown, Carbon nanotubes, Information operations, Scanning electron microscopy, Silicon, Transistors, Argon, Bridges

Proceedings Article | 28 February 2006 Paper
Proceedings Volume 6127, 612716 (2006) https://doi.org/10.1117/12.645526
KEYWORDS: Temperature metrology, Carbon nanotubes, Transistors, Capacitance, Field effect transistors, Carbon, Atomic force microscopy, Atomic force microscope, Measurement devices, Scanning electron microscopy

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