Chang-Yu Jen
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 May 2022 Poster + Paper
Proceedings Volume 12137, 121370O (2022) https://doi.org/10.1117/12.2620056
KEYWORDS: Refractive index, Inspection, Confocal microscopy, Image processing, Multilayers, Objectives, Glasses, Digital image processing, CCD image sensors, Zemax

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