Cheng-Hung Chi
at Optoelectronics Research Ctr
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 October 2024 Presentation
Proceedings Volume PC13111, PC131110M (2024) https://doi.org/10.1117/12.3027208
KEYWORDS: Metrology, Nanostructures, Ultrafast phenomena, Ultrafast measurement systems, Structured light, Statistical analysis, Scattered light, Motion measurement, Light scattering, Cameras

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top