Dr. Chenghao Wan
at Univ of Wisconsin-Madison
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 28 September 2023 Presentation
Hongyan Mei, Guodong Ren, Boyang Zhao, Jad Salman, Gwan-Yeong Jung, Huandong Chen, Shantanu Singh, Arashdeep Thind, John Cavin, Jordan Hachtel, Miaofang Chi, Shanyuan Niu, Graham Joe, Chenghao Wan, Nick Settineri, Simon Teat, Bryan Chakoumakos, Jayakanth Ravichandran, Rohan Mishra, Mikhail Kats
Proceedings Volume PC12657, PC1265702 (2023) https://doi.org/10.1117/12.2676394
KEYWORDS: Anisotropy, Modulation, Strontium, Polarization control, Electrons, Windows, Refractive index, Quantum optics applications, Quantum optics, Quantum limits

Proceedings Article | 5 March 2022 Presentation
Chenghao Wan, Martin Hafermann, Tae Joon Park, Zhen Zhang, Yuzhe Xiao, Hongyan Mei, Shriram Ramanathan, Carsten Ronning, Mikhail Kats
Proceedings Volume PC12010, PC120100A (2022) https://doi.org/10.1117/12.2609034
KEYWORDS: Vanadium, Photonics, Transmittance, Refractive index, Optical properties, Ion beams, Transition metals, Thin films, Switching, Optical components

Proceedings Article | 5 August 2021 Presentation
Chenghao Wan, David Woolf, Colin Hessel, Jad Salman, Yuzhe Xiao, Albert Wright, Joel Hensley, Mikhail Kats
Proceedings Volume 11796, 117961X (2021) https://doi.org/10.1117/12.2594032

Proceedings Article | 21 August 2020 Presentation
Joel Siegel, Jonathan Dwyer, Anjali Suresh, Margaret Fortman, Nathaniel Safron, Chenghao Wan, Jonathan Choi, Wei Wei, Vivek Saraswat, Mikhail Kats, Michael Arnold, Padma Gopalan, Victor Brar
Proceedings Volume 11467, 114670E (2020) https://doi.org/10.1117/12.2571066
KEYWORDS: Graphene, Lithography, Plasmonics, Nanostructures, Plasmons, Nanolithography, Optical lithography, Optoelectronics, Tunable filters, Chemical fiber sensors

Proceedings Article | 19 April 2017 Presentation
Chenghao Wan, Erik Horak, You Zhou, Zhen Zhang, Jad Salman, Patrick Roney, Jura Rensberg, Bradley Gundlach, Shriram Ramanathan, Randall Goldsmith, Carsten Ronning, Mikhail Kats
Proceedings Volume 10105, 101051A (2017) https://doi.org/10.1117/12.2253143
KEYWORDS: Thin film devices, Transition metals, Diodes, Opacity, Vanadium, Finite-difference time-domain method, Optical components, Thermography, Thin films, Absorption

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