Derek Aranguren van Egmond
at National Research Council Canada
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 March 2022 Presentation
Antony Orth, Kathleen Sampson, Kayley Ting, Derek Aranguren van Egmond, Kurtis Laqua, Daniel Webber, Thomas Lacelle, Dorothy Fatehi, Jonathan Boisvert, Chantal Paquet
Proceedings Volume PC12014, PC1201403 (2022) https://doi.org/10.1117/12.2609895
KEYWORDS: Tomography, Additive manufacturing, Distortion, Refraction, Projection systems, Index matching antireflective coatings, X-ray computed tomography, Printing, Metrology

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