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Duane R. Chartier
President & CEO at International Center for Art Intelligence Inc
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 25 May 1998 Paper
Authentication: science and art at odds?
Duane Chartier, Fred Notehelfer
Proceedings Volume 3315, (1998) https://doi.org/10.1117/12.308594
KEYWORDS: Infrared radiation, Head, Ultraviolet radiation, Luminescence, Visible radiation, Testing and analysis, Image processing, Analytical research, Chemical elements, Nondestructive evaluation
Proceedings Volume Editor (2)
SPIE Conference Volume | 16 March 2000
Scientific Detection of Fakery in Art II
SPIE Conference Volume | 25 May 1998
Scientific Detection of Fakery in Art
Conference Committee Involvement (2)
Scientific Detection of Fakery in Art II
20 September 1999 | Boston, MA, United States
Scientific Detection of Fakery in Art
29 January 1998 | San Jose, CA, United States
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