Eion Blanchard
at Univ. of Illinois
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 14 June 2023 Presentation + Paper
Robert Forrest, Daniel Krofcheck, Asael Sorensen, Carter Jameson, Connor Aubry, Eion Blanchard
Proceedings Volume 12531, 1253109 (2023) https://doi.org/10.1117/12.2666138
KEYWORDS: Object detection, X-rays, X-ray imaging, Data modeling, Design and modelling, Detection and tracking algorithms, Performance modeling, Image classification, Education and training, Inspection

Proceedings Article | 3 June 2022 Presentation + Paper
Daniel Krofcheck, Esther John, Hugh Galloway, Asael Sorensen, Carter Jameson, Connor Aubry, Arvind Prasadan, Jennifer Galasso, Eric Goodman, Eion Blanchard, Robert Forrest
Proceedings Volume 12104, 121040F (2022) https://doi.org/10.1117/12.2618978
KEYWORDS: Detection and tracking algorithms, Performance modeling, Data modeling, Process modeling, Evolutionary algorithms, Machine vision, Inspection, X-rays, X-ray detectors, Machine learning

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