Eric M. Frey
Senior Mechanical Engineer at 4D Technology Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 August 2018 Presentation + Paper
Proceedings Volume 10749, 1074910 (2018) https://doi.org/10.1117/12.2322556
KEYWORDS: Interferometers, Modulation, Confocal microscopy, Fizeau interferometers, Cameras, Wavefronts, Polarization, Computer programming, Polarizers, Calibration

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