Dr. Erik W. Bogaart
at ASML Netherlands BV
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 19 January 2009 Paper
E. Bogaart, I. Peters, A. Kleimann, E.J. Manoury, W Klaassens, W.T.F.M. de Laat, C. Draijer, R. Frost, J. Bosiers
Proceedings Volume 7250, 725003 (2009) https://doi.org/10.1117/12.807540
KEYWORDS: Amplifiers, Semiconducting wafers, CCD image sensors, Imaging systems, Image sensors, Sensors, Electrons, Charge-coupled devices, Optical amplifiers, Microlens

Proceedings Article | 5 May 2008 Paper
Jan Bosiers, Holger Stoldt, Wilco Klaassens, Bart Dillen, Inge Peters, Erik Bogaart, Raymond Frost, Laurens Korthout, Jurgen Timpert
Proceedings Volume 6996, 69960Z (2008) https://doi.org/10.1117/12.785847
KEYWORDS: Imaging systems, Charge-coupled devices, Semiconducting wafers, Amplifiers, Sensors, CCD image sensors, Manufacturing, Electrons, Image sensors, Medical imaging

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