CONFERENCE PROCEEDINGS
Advanced Search
Dr. Fabian Friederich
Group Manager at Fraunhofer-ITWM
SPIE Involvement:
Conference Program Committee | Author
Publications (5)
Proceedings Article | 14 March 2018 Presentation
Multilayer thickness inspection with millimeter-waves (Conference Presentation)
Nina Schreiner, Wolfgang Sauer-Greff, Ralph Urbansky, Fabian Friederich
Proceedings Volume 10531, 105310P (2018) https://doi.org/10.1117/12.2300761
KEYWORDS: Inspection, Radar
Proceedings Article | 14 March 2018 Presentation
Millimeter-wave imaging solutions for non-destructive testing (Conference Presentation)
Proceedings Volume 10531, 105310R (2018) https://doi.org/10.1117/12.2300758
KEYWORDS: Millimeter wave imaging, Nondestructive evaluation
Proceedings Article | 24 February 2017 Presentation + Paper
Conception and realization of a semiconductor based 240 GHz full 3D MIMO imaging system
Christian Weisenstein, Matthias Kahl, Fabian Friederich, Peter Haring Bolívar
Proceedings Volume 10103, 101030B (2017) https://doi.org/10.1117/12.2250892
KEYWORDS: Defect detection, Synthetic aperture imaging, Terahertz technology, Composites, Semiconductors, 3D image processing, Imaging systems, Nondestructive evaluation, 3D image reconstruction, Receivers, Transmitters, Point spread functions
SPIE Journal Paper | 21 March 2014
Nondestructive testing potential evaluation of a terahertz frequency-modulated continuous-wave imager for composite materials inspection
Edison Cristofani, Fabian Friederich, Sabine Wohnsiedler, Carsten Matheis, Joachim Jonuscheit, Marijke Vandewal, René Beigang
OE, Vol. 53, Issue 03, 031211, (March 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.3.031211
KEYWORDS: Terahertz radiation, Inspection, Sensors, Nondestructive evaluation, Spatial resolution, Composites, Continuous wave operation, Imaging systems, Solids, Lenses
Proceedings Article | 26 February 2008 Paper
Laser beam shaping for micromaterial processing using a liquid crystal display
Proceedings Volume 6882, 688207 (2008) https://doi.org/10.1117/12.763542
KEYWORDS: Diffraction, Beam shaping, Spatial light modulators, Micromachining, Quantization, Signal to noise ratio, Stars, Liquid crystal on silicon, Diodes, LCDs
Conference Committee Involvement (8)
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVIII
25 January 2025 | San Francisco, California, United States
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVII
29 January 2024 | San Francisco, California, United States
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVI
30 January 2023 | San Francisco, California, United States
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV
25 January 2022 | San Francisco, California, United States
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIV
6 March 2021 | Online Only, California, United States
Showing 5 of 8 Conference Committees
LOAD MORE
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top