Farrell A. Small
Manager/Mechanical Engineering at Brijot Imaging Systems Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 October 2006 Paper
Leon Treyger, Jon Heyl, Michael Fink, Iztok Koren, Yonggang Li, Donald Ronning, Farrell Small, Bin Xian
Proceedings Volume 6349, 63494G (2006) https://doi.org/10.1117/12.686505
KEYWORDS: Photomasks, Chemical vapor deposition, Femtosecond phenomena, Deep ultraviolet, Laser ablation, Metals, Glasses, Objectives, Computer programming, Laser development

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