In order to evaluate the laser induced damage threshold (LIDT) of our HfO2/SiO2 high reflectance films prepared by
reactive electron beam evaporation process at 1064nm and 532nm, the four popular test methods are performed
according to the ISO 11254 and other relevant standards. The improvement of laser conditioning effect and influence of
cumulative effect have been studied and estimated during the tests by comparing the deviations of the thresholds along
the damage probability curves and relationship between the thresholds and the pulses number. Moreover, the details are
carefully inspected during raster scan especially at 1064nm with all the >2μm nodules and damage sites marking and
recording, then the ejection probability and growth rate of nodules are given. Note that attention should be paid to the
submicron absorbing particulates at 532nm which are probable to trigger the damage.
The scanning start angle (SSA), the scanning angle (SA) and the target slope angle (SA) are important parameters of
Linear Array CCD Panoramic Aerial Camera. This paper analyzes the relationship of them and suggests that the current
method of calculating SA is very difficult to be realized in engineering. It proposes an algorithm of calculating SSA and
SA according to TSA. Its main characteristics are, with achieving the overlap rate as a premise, to calculate SSA and SA
reasonably and to try to put the target into the middle of swath coverage, making the coverage as wide as possible. The
algorithm is very simple and is easy to be realized in engineering. The paper gives us the relationship graph between
TSA and SA.
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