Prof. George Nehmetallah
Associate Professor at Catholic Univ of America
SPIE Involvement:
Conference Program Committee | Author | Leadership Workshop Facilitator | Science Fair Judge
Publications (71)

Proceedings Article | 7 June 2024 Presentation + Paper
Jonathan Hixson, Brian Teaney, Michael Finch, Georges Nehmetallah, Ronald Driggers
Proceedings Volume 13045, 130450H (2024) https://doi.org/10.1117/12.3012780
KEYWORDS: Sensors, Detection and tracking algorithms, Modulation transfer functions, Image classification, Sensor performance, Imaging systems, Diffraction

SPIE Journal Paper | 27 August 2022
OE, Vol. 61, Issue 08, 085104, (August 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.8.085104
KEYWORDS: Gas lasers, Carbon monoxide, Laser spectroscopy, Spectroscopy, Mid-IR, Photodetectors, Cardiovascular magnetic resonance imaging, Absorption, Optical engineering, Sensors

Proceedings Article | 3 June 2022 Paper
Proceedings Volume 12121, 121210M (2022) https://doi.org/10.1117/12.2619116
KEYWORDS: Infrared radiation, Sensors, Gas sensors, Infrared sensors, Optical filters, Multiplexers, Gases, Absorption

Proceedings Article | 31 May 2022 Presentation + Paper
Proceedings Volume 12097, 120970Q (2022) https://doi.org/10.1117/12.2619004
KEYWORDS: Machine learning, Performance modeling, Digital holography, Principal component analysis, Microscopy, Holography, Feature selection, Image classification, Holograms

Proceedings Article | 30 May 2022 Presentation + Paper
Proceedings Volume 12116, 121160U (2022) https://doi.org/10.1117/12.2618839
KEYWORDS: Carbon monoxide, Mid-IR, Photodetectors, Absorption, Calibration

Showing 5 of 71 publications
Conference Committee Involvement (15)
Dimensional Optical Metrology and Inspection for Practical Applications XIV
13 April 2025 | Orlando, Florida, United States
Computational Imaging VIII
13 April 2025 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications XIII
24 April 2024 | National Harbor, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications XII
2 May 2023 | Orlando, Florida, United States
Computational Imaging VII
1 May 2023 | Orlando, Florida, United States
Showing 5 of 15 Conference Committees
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