Dr. Guijun Hu Profile

Dr. Guijun Hu

at Jilin Univ

SPIE Involvement:

Author

Publications (8)

Proceedings Article | 9 October 2021 Poster + Paper

Sensitivity analysis of fault detection for few-mode fiber links based on Rayleigh backscattering

Zhenxing He, Feng Liu, Wenping Zhang, Guijun Hu

Proceedings Volume 11901, 1190111 (2021) https://doi.org/10.1117/12.2602403

KEYWORDS: Fusion splicing, Backscatter, Single mode fibers, Signal detection, Analytical research, Fiber optic communications, Signal attenuation, Sensors, Photonics systems, Oscilloscopes

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Proceedings Article | 4 January 2008 Paper

Implementation of OFDM multimode fiber communication system in the Simulink environment

Wei Xie, Guijun Hu, Qing Deng

Proceedings Volume 6837, 68371M (2008) https://doi.org/10.1117/12.753942

KEYWORDS: Multimode fibers, Orthogonal frequency division multiplexing, Simulink, Telecommunications, Computer simulations, Modulation, Channel projecting optics, Electro optical modeling, Optical fibers, Systems modeling

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Proceedings Article | 31 January 2005 Paper

Effect of series and parallel resistance on low-frequency noise level in semiconductor lasers

Guijun Hu

Proceedings Volume 5624, (2005) https://doi.org/10.1117/12.570202

KEYWORDS: Resistance, Semiconductor lasers, Reliability, Diodes, Heterojunctions, Optical communications, Optical testing, Optical storage, Optical sensing, Telecommunications

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Proceedings Article | 12 May 2004 Paper

Simulation and experimental study of high-power fiber lasers

Yuzhai Pan, Jun Zhang, Guijun Hu, Liang Zhang, Ling Zhao, Yongqiang Ning, Yun Liu, Lijun Wang

Proceedings Volume 5280, (2004) https://doi.org/10.1117/12.521633

KEYWORDS: Fiber lasers, Fiber Bragg gratings, Ytterbium, Semiconductor lasers, High power fiber lasers, Absorption, Multimode fibers, Cladding, Optical simulations, Laser resonators

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Proceedings Article | 12 May 2004 Paper

Correlation between the g-r noise in semiconductor lasers and device reliability

Guijun Hu, Yadong Sun, Hongmei Zhang, Jing Li, Yingxue Shi, Jiawei Shi

Proceedings Volume 5280, (2004) https://doi.org/10.1117/12.521647

KEYWORDS: Semiconductor lasers, Reliability, Electrical breakdown, Semiconductors, Power supplies, Heterojunctions, Measurement devices, Atrial fibrillation, Nondestructive evaluation, Chemical analysis

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Proceedings Article | 19 October 2001 Paper

Electrical noise used to estimate the reliability of high-power semiconductor lasers

Guijun Hu, Jiawei Shi, Sumei Zhang, Yi Qu

Proceedings Volume 4580, (2001) https://doi.org/10.1117/12.445000

KEYWORDS: Reliability, High power lasers, Semiconductor lasers, Manufacturing, Nondestructive evaluation, Electronics engineering, Optical communications, Optical testing, Solid state lasers, Fiber amplifiers

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Proceedings Article | 16 October 2001 Paper

Low-frequency terminal electrical noise of high-power quantum well lasers and facet stability

Guijun Hu, Jiawei Shi, Sumei Zhang, Fenggang Zhang

Proceedings Volume 4602, (2001) https://doi.org/10.1117/12.445715

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Proceedings Article | 3 October 2000 Paper

Correlation between the low-frequency electrical noise of high-power quantum well lasers and device quality

Guijun Hu, Jiawei Shi, Sumei Zhang, Yu Lu, LiYun Qi, Hongyan Li, Fenggang Zhang

Proceedings Volume 4220, (2000) https://doi.org/10.1117/12.401718

KEYWORDS: High power lasers, Quantum wells, Semiconductor lasers, Reliability, Astatine, Temperature metrology, Resistance, Electronics engineering, Optoelectronics, Semiconductors

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Showing 5 of 8 publications

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