Hao-Xun Zhan
master's degree at National Central University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 August 2016 Presentation + Paper
Hao-Xun Zhan, Chao-Wen Liang, Shih-Che Chien
Proceedings Volume 9960, 99600O (2016) https://doi.org/10.1117/12.2236289
KEYWORDS: Optical testing, Deflectometry, Optical testing, Wavefronts, Phase shifting, Charge-coupled devices, Pico projectors, Projection systems, Gaussian beams, Wavefront aberrations, Data acquisition

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