Hidab M. Hamwi
at Univ at Buffalo
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 14 March 2009 Paper
Proceedings Volume 7258, 72583B (2009) https://doi.org/10.1117/12.813603
KEYWORDS: Distortion, Sensors, Electron multiplying charge coupled devices, Computer simulations, X-rays, X-ray imaging, Image intensifiers, Fiber optics, Image quality, Image processing

Proceedings Article | 18 March 2008 Paper
Proceedings Volume 6913, 69133T (2008) https://doi.org/10.1117/12.769633
KEYWORDS: Distortion, Electron multiplying charge coupled devices, Sensors, Fiber optics, Image intensifiers, Image quality, Signal to noise ratio, X-ray imaging, X-rays, Solid state electronics

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