On-chip lens-less ptychographic microscopy enables large field-of-view, high-resolution imaging of thin specimens by utilizing multiple intensity images acquired with multi-angle illumination and an iterative phase retrieval algorithm. Image reconstruction in lens-less ptychography, however, heavily relies on accurate forward model for image formation, and thus any discrepancies between forward model and experimental settings (e.g., mismatch in sample-to-detector distance or a slight tilt of object plane) would result in poor reconstruction image quality or inaccurate phase estimation. Here, we propose a deep learning-based autocalibration strategy for lens-less ptychographic microscopy, which does not require precise forward model and large training datasets. Our method is based on untrained neural network that incorporates parameterized physical forward model and system aberration.
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