Dr. James Wylde Profile

Dr. James Wylde

VP, Business Development at 1st Detect

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 7 March 2005 Paper

Integrated MEMS-based variable optical attenuator and 10Gb/s receiver

James Aberson, Pierre Cusin, H. Fettig, Ryan Hickey, James Wylde

Proceedings Volume 5730, (2005) https://doi.org/10.1117/12.592697

KEYWORDS: Microelectromechanical systems, Receivers, Signal attenuation, Semiconducting wafers, Optical amplifiers, Silicon, Reliability, Variable optical attenuators, Optical fibers, Attenuators

Read Abstract +

Proceedings Article | 22 January 2005 Paper

Reliability of a thermally actuated MEMS VOA for optical component applications

Ryan Hickey, Robert Mallard, James Wylde, Thomas Shepperd, John Panton

Proceedings Volume 5716, (2005) https://doi.org/10.1117/12.590835

KEYWORDS: Signal attenuation, Resistance, Microelectromechanical systems, Actuators, Reliability, Monte Carlo methods, Instrument modeling, Optical components, Receivers, Attenuators

Read Abstract +

Proceedings Article | 16 January 2003 Paper

Reliability and qualification of an integrated MEMS attenuator for optical component applications

Ryan Hickey, Heiko Fettig, James Wylde, Stephane Legros, Robert Mallard, Heinz Nentwich, Christopher Hart

Proceedings Volume 4980, (2003) https://doi.org/10.1117/12.472728

KEYWORDS: Microelectromechanical systems, Actuators, Reliability, Failure analysis, Resistance, Oxides, Signal attenuation, Attenuators, Optical components, Instrument modeling

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years