CONFERENCE PROCEEDINGS
Advanced Search
Jan Rinze Peterzon
at ASTRON
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 13 December 2020 Presentation + Paper
Ge immersed grating manufacturing and optical verification for the METIS high-resolution spectrograph
Tibor Agócs, Eddy Elswijk, Daan Zaalberg, Jan Rinze Peterzon, Niels Tromp, Ivan Lloro, Jeffrey Lynn, Ramon Navarro, Takashi Sukegawa, Yukinobu Okura, Stephen Todd, Alistair Glasse, Philip Parr-Burman, Bernhard Brandl, Felix Bettonvil
Proceedings Volume 11451, 114511G (2020) https://doi.org/10.1117/12.2562411
KEYWORDS: Optics manufacturing, Germanium, Spectrographs, Diffraction gratings, Mid-IR, Imaging systems, Spatial resolution, Refractive index, Spectral resolution, Spectroscopy
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top