Prof. Jean-Luc Starck
at Commissariat à l'Energie Atomique
SPIE Involvement:
Author | Instructor
Publications (40)

Proceedings Article | 9 September 2019 Paper
Proceedings Volume 11138, 111380A (2019) https://doi.org/10.1117/12.2530204
KEYWORDS: Signal to noise ratio, Galactic astronomy, Denoising, Image restoration, Deconvolution, Astronomy, Point spread functions, Computer simulations, Wavelet image processing

Proceedings Article | 24 August 2017 Presentation + Paper
Morgan Schmitz, Matthieu Heitz, Nicolas Bonneel, Fred Ngolè, David Coeurjolly, Marco Cuturi, Gabriel Peyré, Jean-Luc Starck
Proceedings Volume 10394, 103940H (2017) https://doi.org/10.1117/12.2270641
KEYWORDS: Point spread functions, Signal processing, Image processing

SPIE Journal Paper | 5 February 2015 Open Access
Grigorios Tsagkatakis, Arnaud Woiselle, George Tzagkarakis, Marc Bousquet, Jean-Luc Starck, Panagiotis Tsakalides
OE, Vol. 54, Issue 03, 031106, (February 2015) https://doi.org/10.1117/12.10.1117/1.OE.54.3.031106
KEYWORDS: Range imaging, Associative arrays, Sensors, Signal processing, Signal to noise ratio, Imaging systems, Pulsed laser operation, Binary data, Cameras, Signal attenuation

Proceedings Article | 2 August 2014 Paper
Marc Sauvage, Pierre Chanial, Gilles Durand, Louis Rodriguez, Jean-Luc Starck, Samuel Ronayette, Hervé Aussel, Vincent Minier, Frédérique Motte, Eric Pantin, Florent Sureau, Robin Terrisse
Proceedings Volume 9143, 91431B (2014) https://doi.org/10.1117/12.2055557
KEYWORDS: Talc, Telescopes, Space telescopes, Point spread functions, Signal to noise ratio, Electroluminescent displays, Galactic astronomy, Spatial resolution, Stars, Signal processing

Proceedings Article | 26 September 2013 Paper
F. Sureau, J. Bobin, J.-L. Starck
Proceedings Volume 8858, 885811 (2013) https://doi.org/10.1117/12.2024040
KEYWORDS: Spherical lenses, Data modeling, Microwave radiation, Wavelets, Inverse problems, Statistical analysis, Instrument modeling, Point spread functions, Synchrotrons, Thermal modeling

Showing 5 of 40 publications
Proceedings Volume Editor (2)

SPIE Conference Volume | 19 December 2002

SPIE Conference Volume | 1 November 2001

Conference Committee Involvement (6)
Wavelets and Sparsity XIV
21 August 2011 | San Diego, California, United States
Wavelets XIII
2 August 2009 | San Diego, California, United States
Wavelets XII
26 August 2007 | San Diego, California, United States
Wavelets XI
31 July 2005 | San Diego, California, United States
Astronomical Data Analysis II
27 August 2002 | Waikoloa, Hawai'i, United States
Showing 5 of 6 Conference Committees
Course Instructor
SC137: Multiscale Analysis Methods in Astronomy and Engineering
Multiscale analysis methods, including wavelet transforms, used for image enhancement, faint feature recognition, image content characterization and fusion are presented in this material. Embedded applications in object detection, image database operations, image and signal compression and transmission, and process control are also discussed. This course explains how image and signal processing methods are used in science operations, product development and visual inspection.
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