Jiansheng Xie
at Jiangsu Polytechnic Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 October 2004 Paper
Proceedings Volume 5564, (2004) https://doi.org/10.1117/12.561411
KEYWORDS: Annealing, Vanadium, Resistance, Argon, Crystals, Oxides, Temperature metrology, Ion beams, Ions, Semiconductors

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