Jing Yuan
at Chongqing Institute of Metrology and Quality Inspection
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 November 2024 Poster + Paper
Proceedings Volume 13238, 132380Y (2024) https://doi.org/10.1117/12.3036884
KEYWORDS: 3D metrology, Optical imaging, Metrology, Imaging systems, 3D image processing, Inspection, Transportation, Signal processing, Manufacturing, Detection and tracking algorithms

Proceedings Article | 20 November 2024 Paper
Proceedings Volume 13243, 1324312 (2024) https://doi.org/10.1117/12.3036885
KEYWORDS: Optical imaging, Imaging systems, Image sensors, Sensors, Optical sensors, Metrology, Signal processing, Manufacturing, Inspection, Image fusion

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top