Dr. Joel Leger
at Air Force Research Lab.
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 13 March 2024 Presentation + Paper
Proceedings Volume 12897, 128970E (2024) https://doi.org/10.1117/12.3001582
KEYWORDS: Diffraction, Semiconducting wafers, Manufacturing, Lenses, Metalenses, Scanning electron microscopy, Wafer level optics, Design, Silicon, Mid infrared

Proceedings Article | 17 March 2023 Presentation
Proceedings Volume PC12432, PC124320I (2023) https://doi.org/10.1117/12.2649327
KEYWORDS: Modulation transfer functions, Testing and analysis, Semiconducting wafers, Prototyping, Optics manufacturing, Optical fabrication equipment, Optical fabrication, Optical components, Metrology, Lenses

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