CONFERENCE PROCEEDINGS
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John M. Fleischer
President at Photon Inc
SPIE Involvement:
Author
Publications (4)
Proceedings Article | 30 May 2003 Paper
Characterization of the near-field profile of semiconductor lasers and the spot size of tightly focused laser beams from far-field measurements
Proceedings Volume 4932, (2003) https://doi.org/10.1117/12.472393
KEYWORDS: Near field, Cameras, Vertical cavity surface emitting lasers, Semiconductor lasers, Fourier transforms, CCD cameras, Radiometry, Diffraction, Optical fibers, Phase retrieval
Proceedings Article | 17 April 1995 Paper
Measurement of the absolute accuracy (to <0.5%) of a clip-level beam profiler using Fresnel diffraction by a wide slit
Thomas Johnston, John Fleischer
Proceedings Volume 2375, (1995) https://doi.org/10.1117/12.206987
KEYWORDS: Near field diffraction, Convolution, Diffraction, Fringe analysis, Beam analyzers, Optical testing, Wavefronts, Oscilloscopes, Near field optics, Head
Proceedings Article | 22 April 1993 Paper
ATP: continuously variable attenuator for true laser profiles
Proceedings Volume 1834, (1993) https://doi.org/10.1117/12.143863
KEYWORDS: Attenuators, Acquisition tracking and pointing, Signal attenuation, Absorbance, Glasses, Laser energy, CCD cameras, Laser sources, Sensors, Charge-coupled devices
Proceedings Article | 1 May 1991 Paper
Laser beam width, divergence, and propagation factor: status and experience with the draft standard
Proceedings Volume 1414, (1991) https://doi.org/10.1117/12.43659
KEYWORDS: Standards development, Laser beam propagation, Laser beam diagnostics, Collimation, Beam propagation method, Diffraction, Distance measurement, Measurement devices, Modes of laser operation, Physics
Proceedings Volume Editor (1)
SPIE Conference Volume | 6 July 1989
Hard Copy Output
Conference Committee Involvement (1)
Hard Copy Output
15 January 1989 | Los Angeles, CA, United States
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