Dr. John E. Wise
at GE Panametrics
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 15 September 2004 Paper
John Wise, Geoffrey Gaines, Arthur Gaudet, Mark Gummin, Fred Hanser, Allen Harris, Stephen Hersey, Benjawan Kjornrattanawanich
Proceedings Volume 5549, (2004) https://doi.org/10.1117/12.559986
KEYWORDS: Extreme ultraviolet, Photodiodes, Calibration, Sensors, Data modeling, Prototyping, Solar energy, Visible radiation, Error analysis, Diffraction gratings

Proceedings Article | 25 November 1999 Paper
John Seely, Raj Korde, Frederick Hanser, J. Wise, Glenn Holland, James Weaver, Jack Rife
Proceedings Volume 3764, (1999) https://doi.org/10.1117/12.371077
KEYWORDS: Photodiodes, Silicon, Sensors, Monochromators, Titanium, Transmittance, Multilayers, Absorption, Aluminum, Carbon

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