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Jonathan T. Fong
Program Manager
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 1 April 2010 Paper
Advances in DMD-based UV application reliability below 320nm
Jonathan Fong, Tom Winter, S. Josh Jacobs
Proceedings Volume 7637, 763718 (2010) https://doi.org/10.1117/12.848461
KEYWORDS: Digital micromirror devices, Ultraviolet radiation, Maskless lithography, Reliability, Lithography, Mirrors, LCDs, Manufacturing, Sapphire, Micromirrors
Conference Committee Involvement (2)
Emerging Digital Micromirror Device Based Systems and Applications IV
23 January 2012 | San Francisco, California, United States
Emerging Digital Micromirror Device Based Systems and Applications III
26 January 2011 | San Francisco, California, United States
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