Dr. Joo-Von Kim
Research Associate at Institut d'Électronique Fondamentale
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 August 2009 Paper
T. Devolder, Joo-Von Kim, M. Manfrini, G. Hrkac, P. Crozat, L. Lagae, T. Schrefl, C. Chappert
Proceedings Volume 7398, 739808 (2009) https://doi.org/10.1117/12.826879
KEYWORDS: Magnetism, Resistance, Electrodes, Multilayers, Lithography, Anisotropy, Spherical lenses, Zeeman effect, Waveguides, Ferromagnetics

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