Dr. Joseph G. Gordon
Manager at IBM Research - Almaden
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 November 1991 Paper
Michael Toney, Joseph Gordon, Owen Melroy
Proceedings Volume 1550, (1991) https://doi.org/10.1117/12.49475
KEYWORDS: Silver, Electrodes, Bismuth, X-rays, Scattering, Metals, Interfaces, Diffraction, Modulation, Materials analysis

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