Prof. Khaled J. Habib Profile

Prof. Khaled J. Habib

S.Research Scientist/Full Research Professor at Kuwait Institute for Scientific Research

SPIE Involvement:

Author

Area of Expertise:

Techniques of optical interferometry , Holographic interferometry , Shearography , Science & Technology of new instruments of electrochemistry , NDT methods of materials evaluation in corrosive media , Metallic Corrosion

Websites:

Personal Website

Profile Summary

Dr. Khaled Habib holds a Ph.D in Chem. and Mats. Engr. from the Optical Science and Technological Center of University of Iowa, Iowa, USA, 1988. He was a Post-doctoral Fellow at the Chem. Engr. Dept., and Mat. sci. Dept., of the Technical University of Aachen, Aachen, Germany, 1991-1992. He specializes in “Quantum Electrochemistry” and more specifically “Opto-electrochemical instruments” in which solely light (as a quantum tool) can be used not only for submicroscopic imaging of surface/interface phenomena of solids in electrolytes, but also, it can be used in situ to measure electrochemical parameters corresponding to the surface/interface phenomena of the solids. Also, Materials Science, Metallic corrosion, and Characterization of nanometer structures of metallic glasses are of interest. Mr. Habib has in his credit more than 126 articles in international refereed journals in his area of specialization. He is a fellow of the SPIE (http://spie.org/x38.xml). Also, he is a member of the international Corrosion Council (ICC), (http://www.icc-net.org/ICCmembers_Kuwait.html). In addition, he is a Member of the editorial board of five Journals; the journal of Corrosion Science and Technology(j-cst.org/sub/committee.asp), the Journal of Environmental Science and Engineering A&B (http://www.davidpublishing.com/journals_info.asp?jId=1025),the American Journal of Applied Chemistry(http://www.sciencepublishinggroup.com/journal/peerreviewers.aspx?journalid=227), the journal of Science Research(http://www.sciencepublishinggroup.com/journal/editorialboard.aspx?journalid=181), the journal of Advances in Petroleum Exploration and Development(http://cscanada.net/index.php/aped/about/editorialTeam).
He has been a reviewer for a number of journals; Optics and Lasers in Engineering, Applied Optics, Optical Engineering, Optics and Lasers Technology, the Optical Expression, IEEE Transaction Instruments and Measurements, the ASTM journal of Testing and Evaluation,

Publications (47)

Proceedings Article | 5 May 2012 Paper

Paper

Failure of thin organic films by a combination of shearography and electrochemical impedance spectroscopy: the new concept of resistivity

Khaled Habib

Proceedings Volume 8430, 84300B (2012) https://doi.org/10.1117/12.924232

KEYWORDS: Carbon, Shearography, Optical coatings, Thin films, Temperature metrology, Gold, Polishing, Dielectric spectroscopy, Thin film coatings, Ultraviolet radiation

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Proceedings Article | 14 September 2011 Paper

Paper

Surface resistivity/conductivity of different organic-thin films by shearography

Khaled Habib

Proceedings Volume 8133, 81330Q (2011) https://doi.org/10.1117/12.888906

KEYWORDS: Carbon, Shearography, Optical coatings, Temperature metrology, Natural surfaces, Resistance, Dielectric spectroscopy, Electrodes, Cameras, Time metrology

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Proceedings Article | 27 May 2011 Paper

Paper

Measurement of surface resistivity/conductivity of carbon steel in 5-20ppm of KGR-134 inhibited seawater by holographic interferometry techniques

K. Habib

Proceedings Volume 8082, 80822A (2011) https://doi.org/10.1117/12.881834

KEYWORDS: Carbon, Oxides, Holographic interferometry, Corrosion, Iron, Electromagnetism, Resistance, Optical interferometry, Mathematical modeling, Temperature metrology

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Optical interferometry techniques were used for the first time to measure the surface resistivity/conductivity of carbon steel samples in blank seawater and in seawater with different concentrations of a corrosion inhibitor, without any physical contact. The measurement of the surface resistivity/conductivity of carbon steel samples was carried out in blank seawater and in seawater with a concentration range of 5-20ppm of KGR-134 corrosion inhibitor, at room temperature. In this investigation, the real-time holographic interferometry was carried out to measure the thickness of anodic dissolved layer or the total thickness, U_total, of formed oxide layer of carbon steel samples during the alternating current (AC) impedance of the samples in blank seawater and in 5-20 ppm KGR-134 inhibited seawater, respectively. In other words, the surface resistivity/conductivity of carbon steel samples was determined simultaneously by holographic interferometry, an electromagnetic method, and by the Electrochemical Impedance (E.I) spectroscopy, an electronic method. In addition, a mathematical model was derived in order to correlate between the AC impedance (resistance) and to the surface (orthogonal) displacement of the surface of the samples in solutions. In other words, a proportionality constant (surface resistivity (ρ) or surface conductivity(σ)=1/[ surface resistivity (ρ)] between the determined AC impedance (by EIS technique) and the orthogonal displacement (by the optical interferometry techniques) was obtained. Consequently the values ρ and σ of the carbon steel samples in solutions were obtained. Also, the value of ρ from other source were used for comparison sake with the calculated values of this investigation. This study revealed that the oxide film of the carbon steel sample has been removed from the surface of the sample, in the blank seawater. Therefore, the corresponding value of the resistivity to such layer remained the same as the value of the resistivity of the carbon steel sample in air, around 1x10^-5 Ohms-cm. On the contrary, the measured values of the resistivity of the carbon steel samples were 4.91x10⁷ Ohms-cm , 5.1x10⁷ Ohms-cm, and 4.2x10⁷ Ohms-cm in 5ppm,10ppm, and 20ppm KGR-134 inhibited seawater solutions, respectively. Furthermore, the determined value range of the ρ of the formed oxide layers, 1.9x107 Ohms-cm to 4.91x107 Ohms-cm, is found in a reasonable agreement with the one found in literature for the Fe Oxide-hydroxides, i.e., Goethite(α-FeOOH) and for the Lepidocrocite (γ-FeOOH), 1x10⁹ Ohms-cm. The ρ value of the Goethite(α-FeOOH) and of the Lepidocrocite (γ-FeOOH), 1x10⁹ Ohms-cm, was found slightly higher than the ρ value range of the formed oxide layer of the present study. This because the former value was determined by a DC method rather than by an electromagnetic method,i.e., holographic interferometry, with applications of EIS, i.e., AC method. As a result, erroneous measurements were recorded due to the introduction of heat to Fe oxide-hydroxides. This led to higher value of the resistivity of the Goethite(α-FeOOH) and for the Lepidocrocite (γ-FeOOH) ),1x10⁹ Ohms-cm, compared to the determined value range of the resistivity of the formed oxide layers, 4.2x10⁷ Ohms-cm to 5.1x10⁷ Ohms-cm.

Proceedings Article | 11 May 2011 Paper

Paper

Measurement of surface resistivity/conductivity of carbon steel in 5-20ppm of TROS C-70 inhibited seawater by optical interferometry techniques

Khaled Habib

Proceedings Volume 8074, 80740Q (2011) https://doi.org/10.1117/12.877628

KEYWORDS: Carbon, Oxides, Holographic interferometry, Corrosion, Iron, Optical interferometry, Resistance, Electromagnetism, Mathematical modeling, Interferometry

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ptical interferometry techniques were used for the first time to measure the volume resistivity/conductivity of carbon steel samples in seawater with different concentrations of a corrosion inhibitor. In this investigation, the real-time holographic interferometric was carried out to measure the thickness of anodic dissolved layer or the total thickness , U_total , of formed oxide layer of carbon steel samples during the alternating current (AC) impedance of the samples in blank seawater and in 5-20 ppm TROS C-70 inhibited seawater, respectively. In addition, a mathematical model was derived in order to correlate between the AC impedance (resistance) and to the surface (orthogonal) displacement of the surface of the samples in solutions. In other words, a proportionality constant ( resistivity (ρ) or conductivity(σ)=1/[ resistivity (ρ)]) between the determined AC impedance (by EIS technique) and the orthogonal displacement (by the optical interferometry techniques) was obtained. The value of the resistivity of the carbon steel sample in the blank seawater was found similar to the value of the resistivity of the carbon steel sample air, around 1x10^-5 Ohms-cm. On the contrary, the measured values of the resistivity of the carbon steel samples were 1.85x10⁷ Ohms-cm , 3.35.x10⁷ Ohms-cm, and 1.7x10⁷ Ohmscm in 5ppm,10ppm, and 20ppm TROS C-70 inhibited seawater solutions, respectively. Furthermore, the determined value range of the ρ of the formed oxide layers, 1.7x10⁷ Ohms-cm to 3.35.x10⁷ Ohms-cm, is found in a reasonable agreement with the one found in literature for the Fe Oxide-hydroxides, i.e., Goethite(α-FeOOH) and for the Lepidocrocite (γ-FeOOH), 1x109 Ohms-cm. The ρ value of the Fe Oxide-hydroxides, 1x10⁹ Ohms-cm, was found slightly higher than the ρ value range of the formed oxide layer of the present study. This because the former value was determined by a DC method rather than by an electromagnetic method, i.e., holographic interferometry, with applications of EIS, i.e., AC method. As a result, erroneous measurements were recorded due to the introduction of heat to Fe oxidehydroxides.

Proceedings Article | 3 August 2010 Paper

Paper

Measurement of surface resistivity/conductivity of carbon steel in 5-20ppm of RA-41 inhibited seawater by optical interferometry techniques

K. Habib

Proceedings Volume 7790, 779010 (2010) https://doi.org/10.1117/12.855191

KEYWORDS: Carbon, Oxides, Holographic interferometry, Corrosion, Iron, Optical interferometry, Electromagnetism, Resistance, Mathematical modeling, Temperature metrology

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Optical interferometry techniques were used for the first time to measure the surface resistivity/conductivity of carbon steel samples in blank seawater and in seawater with different concentrations of a corrosion inhibitor, without any physical contact. The measurement of the surface resistivity/conductivity of carbon steel samples was carried out in blank seawater and in seawater with a concentration range of 5-20ppm of RA-41 corrosion inhibitor, at room temperature. In this investigation, the real-time holographic interferometric was carried out to measure the thickness of anodic dissolved layer or the total thickness, U_total, of formed oxide layer of carbon steel samples during the alternating current (AC) impedance of the samples in blank seawater and in 5-20 ppm RA-41 inhibited seawater, respectively. In other words, the surface resistivity/conductivity of carbon steel samples was determined simultaneously by holographic interferometry, an electromagnetic method, and by the Electrochemical Impedance (E.I) spectroscopy, an electronic method. In addition, a mathematical model was derived in order to correlate between the AC impedance (resistance) and to the surface (orthogonal) displacement of the surface of the samples in solutions. In other words, a proportionality constant (surface resistivity (ρ) or surface conductivity(σ)=1/[surface resistivity (ρ)] between the determined AC impedance (by EIS technique) and the orthogonal displacement (by the optical interferometry techniques) was obtained. Consequently the values ρ and σ of the carbon steel samples in solutions were obtained. Also, the value of ρ from other source were used for comparison sake with the calculated values of this investigation. This study revealed that the thickness of the anodic dissolved layer of the carbon steel sample has been removed from the surface of the sample, in the blank seawater. Therefore, the corresponding value of the resistivity to such layer remained the same as the value of the resistivity of the carbon steel sample in air, around 1x10^-5 Ohms-cm. On the contrary, the measured values of the resistivity of the carbon steel samples were 2.4x10⁶ Ohms-cm, 2.2x10⁷ Ohms-cm, and 1.1x10⁸ Ohms-cm in 5ppm,10ppm, and 20ppm RA-41 inhibited seawater solutions, respectively. Furthermore, the determined value range of the ρ of the formed oxide layers, 2.4x10⁶ Ohms-cm to 1.1x10⁸ Ohms-cm, is found in a reasonable agreement with the one found in literature for the Fe Oxide-hydroxides, i.e., Goethite(α-FeOOH) and for the Lepidocrocite (γ-FeOOH), 1x10⁹ Ohms-cm. The ρ value of the Goethite(α-FeOOH) and of the Lepidocrocite (γ-FeOOH), 1x10⁹ Ohms-cm, was found slightly higher than the ρ value range of the formed oxide layer of the present study. This because the former value was determined by a DC method rather than by an electromagnetic method,i.e., holographic interferometry, with applications of EIS, i.e., AC method. As a result, erroneous measurements were recorded due to the introduction of heat to Fe oxide-hydroxides. This led to higher value of the resistivity of the Goethite(α-FeOOH) and for the Lepidocrocite (γ-FeOOH)), 1x10⁹ Ohms-cm, compared to the determined value range of the resistivity of the formed oxide layers, 2.4x10⁶ Ohms-cm to 1.1x10⁸ Ohms-cm.

Proceedings Article | 20 May 2010 Paper

Paper

Determination of oxide barrier-film thickness of anodized aluminum by electrochemical impedance spectroscopy at the nanometer scale

K. Habib

Proceedings Volume 7743, 774304 (2010) https://doi.org/10.1117/12.861960

KEYWORDS: Oxides, Aluminum, Resistance, Capacitance, Mathematical modeling, Polarization, Oxygen, Dielectric spectroscopy, Particles, Electrodes

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Proceedings Article | 9 April 2010 Paper

Paper

Measurement of surface resistivity/conductivity of anodized aluminium alloy by optical interferometry techniques

K. Habib

Proceedings Volume 7649, 764922 (2010) https://doi.org/10.1117/12.848684

KEYWORDS: Aluminum, Oxides, Optical interferometry, Holographic interferometry, Resistance, Dielectric spectroscopy, Mathematical modeling, Metals, Holography, Photography

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Optical interferometry techniques was used for the first time to measure the surface resistivity/conductivity of anodized aluminium samples in aqueous solution without any physical contact. The anodization process (oxidation) of the aluminium samples was carried out in different sulphuric acid solutions (1.0-2.5 % H₂SO₄), by the technique of electrochemical impedance spectroscopy (EIS), at room temperature. In the mean time, the real-time holographic interferometric was carried out to measure the thickness of anodized (oxide) film of the aluminium samples during the anodization processes. Then, the alternating current (AC) impedance (resistance) of the anodized aluminium samples was determined by the technique of electrochemical impedance spectroscopy (EIS) in different sulphuric acid solutions (1.0-2.5 % H₂SO₄) at room temperature. In addition, a mathematical model was derived in order to correlate between the AC impedance (resistance) and to the surface (orthogonal) displacement of the samples in solutions. In other words, a proportionality constant (surface resistivity or conductivity=1/ surface resistivity) between the determined AC impedance (by EIS technique) and the orthogonal displacement (by the optical interferometry techniques) was obtained. Consequently the surface resistivity (ρ) and conductivity (σ) of the aluminum samples in solutions were obtained. Also, electrical resistivity values (ρ) from other source were used for comparison sake with the calculated values of this investigation. This study revealed that the measured value of the resistivity for the anodized aluminium samples were 2.8×10⁹, 7×10¹², 2.5×10¹³, and 1.4 ×10¹² Ohms-cm in 1.0%,1.5%, 2.0%, and 2.5 % H₂SO₄ solutions, respectively. In fact, the determined value range of the resistivity is in a good agreement with the one found in literature for the aluminium oxide ,85% Al₂O₃ (5×10¹⁰ Ohms-cm in air at temperature 30C°), 96% Al₂O₃ (1×10¹⁴ Ohms-cm in air at temperature 30C°), and 99.7% Al₂O₃ (>1×10¹⁴ Ohmscm in air at temperature 30C°).

Proceedings Article | 26 January 2010 Paper

Paper

Measurement of surface resistivity/conductivity of metallic alloys in aqueous solutions by optical interferometry techniques

K. Habib

Proceedings Volume 7536, 75360D (2010) https://doi.org/10.1117/12.833750

KEYWORDS: Polarization, Aluminum, Oxides, Copper, Temperature metrology, Resistance, Optical interferometry, Photography, Holographic interferometry, Corrosion

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Optical interferometry techniques was use for the first time to measure the surface resistivity/conductivity of the pure aluminium (in seawater at room temperature), UNS.No305 stainless steel (in seawater at room temperature), and pure copper (in tab water at room temperature) without any physical contact. This was achieved by applying an electrical potential across the alloys and measuring the current density flow across the alloys, during the cyclic polarization test of the alloys in different solutions. In the mean time, optical iterferometry techniques such as holographic interferometry was used in situ to measure the orthogonal surface displacement of the alloys, as a result of the applied electrical potential. In addition, a mathematical model was derived in order to correlate the ratio of the electrical potential to the current density flow (electrical potential/electronic Current flow=resistance) and to the surface (orthogonal) displacement of the metallic samples. In other words, a proportionality constant (surface resistivity or conductivity=1/ surface resistivity) between the measured electrical resistance and the surface displacement (by the optical interferometry techniques) was obtained. Consequently the surface resistivity (ρ) and conductivity (σ) of the pure aluminium (in seawater at room temperature), UNS.No305 stainless steel (in seawater at room temperature), and pure copper (in tab water at room temperature ) were obtained. Also, electrical resistivity values (ρ) from other source were used for comparison sake with the calculated values of this investigation. This study revealed that the measured value of the resistivity for the pure aluminium (7.7x1010 Ohms-cm in seawater at room temperature) is in a good agreement with the one found in literature for the Aluminium Oxide ,85% Al2O3 (5X10 10 Ohms-cm in air at temperature 30C0). Unfortunately, there is no measured values for the resistivity of cupric oxide (CuO), Cuprous Oxide (Cu2O), or even the oxide of the UNS.No304 stainless steel in literature to compared those values with the measured values in this study.

Proceedings Article | 9 April 2009 Paper

Paper

Measurement of surface resistivity/conductivity of Si waver by optical interferometry techniques

K. Habib, S. Habib

Proceedings Volume 7294, 729417 (2009) https://doi.org/10.1117/12.814869

KEYWORDS: Silicon, Optical interferometry, Resistance, Oxides, Holographic interferometry, Aluminum, Mathematical modeling, Metals, Time metrology, Nondestructive evaluation

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Proceedings Article | 3 October 2008 Paper

Paper

Inspection of thin films failure: optical shearography versus electrochemical impedance spectroscopy

K. Habib, F. Al-Sabti

Proceedings Volume 7155, 71553C (2008) https://doi.org/10.1117/12.814622

KEYWORDS: Coating, Carbon, Shearography, Temperature metrology, Thin films, Solids, Thin film coatings, Nondestructive evaluation, Cameras, Inspection

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In the present work, the temperature versus thermal deformation (strain) with respect to time, of different coating films were studied by a non-destructive technique (NDT) known as shearography. An organic coating, i.e., ACE Premium Enamel, on a metallic alloy, i.e., a carbon steel, was investigated at a temperature range simulating the severe weather temperatures in Kuwait especially between the daylight and the night time temperatures, 20-60 °C. The investigation focused on determining the in-plane displacement of the coating, which amounts to the thermal deformation (strain) with respect to the applied temperature range. Furthermore, the investigation focused on determining the thermal expansion coefficients of coatings, the slope of the plot of the thermal deformation (strain) versus the applied temperature range. In other words, one could determine, from the decreasing value of the thermal expansion coefficients of coatings, a critical (steady state) value of the thermal expansion coefficients of coatings, in which the integrity of the coatings can be assessed with respect to time. In fact, determination of critical (steady state) value of the thermal expansion coefficients of coatings could be accomplished independent of parameters, i.e., UV exposure, humidity, exposure to chemical species, and so on, normally are considered in conventional methods of the assessment of the integrity of coatings. In other words, with the technique of shearography, one would need only to determine the critical (steady state) value of the thermal expansion coefficients of coatings, regardless of the history of the coating, in order to assess the integrity of coatings. Furthermore, results of shearography indicate that the technique is very useful NDT method not only for determining the critical value of the thermal expansion coefficients of different coatings, but also the technique can be used as a 2D- microscope for monitoring the deformation of the coatings in real-time at a submicroscopic scale.

Proceedings Article | 9 September 2008 Paper

Paper

Measurement of oxide barrier-film thickness of Al alloy by electrochemical impedance spectroscopy at the nanometre scale

K. Habib

Proceedings Volume 7042, 70420E (2008) https://doi.org/10.1117/12.792647

KEYWORDS: Oxides, Aluminum, Resistance, Capacitance, Polarization, Oxygen, Dielectric spectroscopy, Mathematical modeling, Particles, Electrodes

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Proceedings Article | 16 May 2007 Paper

Paper

New criterion of thin film failure of different organic coatings by shearography

K. Habib

Proceedings Volume 6422, 64221G (2007) https://doi.org/10.1117/12.742361

KEYWORDS: Carbon, Shearography, Thin film coatings, Temperature metrology, Thin films, Solids, Nondestructive evaluation, Cameras, Ultraviolet radiation, Humidity

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In the present work, the temperature versus thermal deformation (strain) with respect to time, of different coating films were studied by a nondestructive technique (NDT) known as shearography. An organic coating, i.e., ACE Premium Enamel, on a metallic alloy, i.e., a carbon steel, was investigated at a temperature range simulating the severe weather temperatures in Kuwait especially between the daylight and the night time temperatures, 20-60 °C. The investigation focused on determining the in-plane displacement of the coating, which amounts to the thermal deformation (strain) with respect to the applied temperature range. Furthermore, the investigation focused on determining the thermal expansion coefficients of coatings, the slope of the plot of the thermal deformation (strain) versus the applied temperature range. In other words, one could determine, from the decreasing value of the thermal expansion coefficients of coatings, a critical (steady state) value of the thermal expansion coefficients of coatings, in which the integrity of the coatings can be assessed with respect to time. In fact, determination of critical (steady state) value of the thermal expansion coefficients of coatings could be accomplished independent of parameters, i.e., UV exposure, Humidity, exposure to chemical species, and so on, normally are considered in conventional methods of the assessment of the integrity of coatings. In other words, with the technique of shearography, one would need only to determine the critical (steady state) value of the thermal expansion coefficients of coatings, regardless of the history of the coating, in order to assess the integrity of coatings. Furthermore, results of shearography indicate that the technique is very useful NDT method not only for determining the critical value of the thermal expansion coefficients of different coatings, but also the technique can be used as a 2D microscope for monitoring the deformation of the coatings in real-time at a submicroscopic scale.

Proceedings Article | 21 February 2007 Paper

Paper

Critical assessment of the integrity of thin organic films by shearography

K. Habib

Proceedings Volume 6501, 65010U (2007) https://doi.org/10.1117/12.705082

KEYWORDS: Coating, Carbon, Temperature metrology, Shearography, Epoxies, Thin films, Solids, Thin film coatings, Nondestructive evaluation, Cameras

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In the present work, the temperature versus thermal deformation (strain) with respect to time, of different coating films were studied by a non-destructive technique (NDT) known as shearography. An organic coating, i.e., epoxy, a white enamel, and a yellow Acrylic Lacquer on a metallic alloy, i.e., carbon steels, were investigated at a temperature range simulating the severe weather temperatures in Kuwait especially between the daylight and the night time temperatures, 20-60 °C. The investigation focused on determining the in-plane displacement of the coatings, which amounts to the thermal deformation (strain) with respect to the applied temperature range. Furthermore, the investigation focused on determining the thermal expansion coefficients of coatings, the slope of the plot of the thermal deformation (strain) versus the applied temperature range. In other words, one could determine, from the decreasing value of the thermal expansion coefficients of coatings, a critical (steady state) value of the thermal expansion coefficients of coatings, in which the integrity of the coatings can be assessed with respect to time. In fact, determination of critical (steady state) value of the thermal expansion coefficients of coatings could be accomplished independent of parameters, i.e., UV exposure, Humidity, exposure to chemical species, and so on, normally are considered in conventional methods of the assessment of the integrity of coatings. In other words, with the technique of shearography, one would need only to determine the critical (steady state) value of the thermal expansion coefficients of coatings, regardless of the history of the coating, in order to assess the integrity of coatings. Furthermore, results of shearography indicate that the technique is very useful NDT method not only for determining the critical value of the thermal expansion coefficients of different coatings, but also the technique can be used as a 2D- microscope for monitoring the deformation of the coatings in realtime at a submicroscopic scale.

Proceedings Article | 14 August 2006 Paper

Paper

Novel approach of integrity assessment of thin film of different coatings by shearography

K. Habib

Proceedings Volume 6293, 62930G (2006) https://doi.org/10.1117/12.677116

KEYWORDS: Carbon, Shearography, Thin film coatings, Temperature metrology, Thin films, Solids, Nondestructive evaluation, Cameras, Ultraviolet radiation, Humidity

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In the present work, the temperature versus thermal Ldformation (strain) with respect to time, of different coating films were studied by a non-destructive technique (NDT) known as shearography. An organic coating, i.e., ACE Premium Enamel, on a metallic alloy, i.e., a carbon steel, was investigated at a temperature range simulating the severe weather temperatures in Kuwait especially between the daylight and the night time temperatures, 20-60 °C. The investigation focused on determining the in-plane displacement of the coating, which amounts to the thermal deformation (strain) with respect to the applied temperature range. Furthermore, the investigation focused on determining the thermal expansion coefficients of coatings, the slope of the plot of the thermal deformation (strain) versus the applied temperature range. In other words, one could determine, from the decreasing value of the thermal expansion coefficients of coatings, a critical (steady state) value of the thermal expansion coefficients of coatings, in which the integrity of the coatings can be assessed with respect to time. In fact, determination of critical (steady state) value of the thermal expansion coefficients of coatings could be accomplished independent of parameters, i.e., UV exposure, Humidity, exposure to chemical species, and so on, normally are considered in conventional methods of the assessment of the integrity of coatings. In other words, with the technique of shearography, one would need only to determine the critical (steady state) value of the thermal expansion coefficients of coatings, regardless of the history of the coating, in order to assess the integrity of coatings. Furthermore, results of shearography indicate that the technique is very useful NDT method not only for determining the critical value of the thermal expansion coefficients of different coatings, but also the technique can be used as a 2D- microscope for monitoring the deformation of the coatings in real-time at a submicroscopic scale.

Proceedings Article | 7 March 2006 Paper

Paper

AC impedance-emission spectroscopy of determining the electrochemical behavior of anodized aluminum in aqueous solutions

Khaled Habib, Sami Habib

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498387

KEYWORDS: Aluminum, Oxides, Holographic interferometry, Metals, Transducers, Photography, Spectroscopy, Capacitance, Emission spectroscopy, Holography

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Proceedings Article | 3 June 2005 Paper

Paper

D.L. capacitance-emission spectroscopy of determining the electrochemical behavior of anodized aluminium in aqueous solutions

K. Habib

Proceedings Volume 5826, (2005) https://doi.org/10.1117/12.584703

KEYWORDS: Aluminum, Oxides, Capacitance, Holographic interferometry, Metals, Transducers, Spectroscopy, Photography, Emission spectroscopy, Oxidation

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Proceedings Article | 14 February 2005 Paper

Paper

2D thermography of organic coating behaviors at high temperatures

Khaled Habib, Amer al-Arbeed

Proceedings Volume 5776, (2005) https://doi.org/10.1117/12.611634

KEYWORDS: Shearography, Carbon, Temperature metrology, Nondestructive evaluation, Epoxies, Metals, Cameras, Natural surfaces, Imaging systems, Thermography

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Proceedings Article | 14 February 2005 Paper

Paper

Measurement of the electrical resistance of aluminium samples in sulphuric acid solutions by optical interferometry techniques

Khaled Habib

Proceedings Volume 5776, (2005) https://doi.org/10.1117/12.611640

KEYWORDS: Aluminum, Resistance, Oxides, Holographic interferometry, Corrosion, Metals, Laser optics, Photography, Holography, Oxidation

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Proceedings Article | 2 August 2004 Paper

Paper

Thermally induced deformations measured by shearography

Khaled Habib

Proceedings Volume 5532, (2004) https://doi.org/10.1117/12.555969

KEYWORDS: Coating, Shearography, Temperature metrology, Carbon, Nondestructive evaluation, Epoxies, Metals, Cameras, Interferometry, Natural surfaces

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Proceedings Article | 30 May 2003 Paper

Paper

Fundamentals and applications of laser-optical interferometry as electromagnetic tools for materials evaluation in complex medias

Anwer Habib, Khaled Habib

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.508364

KEYWORDS: Corrosion, Carbon, Interferometry, Holographic interferometry, Laser interferometry, Spectroscopy, Optical testing, Laser applications, Electromagnetism, Transducers

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Proceedings Article | 16 August 2002 Paper

Paper

Virtual bands model in porous silicon

Bassam Alfeeli, Khaled Habib

Proceedings Volume 4775, (2002) https://doi.org/10.1117/12.479650

KEYWORDS: Silicon, Stereolithography, Picosecond phenomena, Luminescence, Carrier dynamics, V band, Chemistry, Systems modeling, Statistical modeling, Lithium

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Proceedings Article | 14 August 2001 Paper

Paper

Modified electrochemical emission spectroscopy (MEES) of detection of crevice corrosion of metallic alloys

Khaled Habib, Kaheld Al-Muhana

Proceedings Volume 4419, (2001) https://doi.org/10.1117/12.437229

KEYWORDS: Corrosion, Actinium, Electrodes, Carbon, Metals, Emission spectroscopy, Optical testing, Tin, Electromagnetic coupling, Ions

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An early stage of crevice corrosion of an epoxy coated sample of pure aluminium, a stainless steel, and low carbon steel in 1M, KCl, 1M NaCl, and 1M NaOH solutions, respectively, was investigated in situ by a new method. The new method of crevice corrosion detection is based on the optical corrosion-meter for measuring the corrosion current density and on a modified electrochemical noise technique for determining the corrosion admittance at the open circuit potential of the alloys in solutions. The observations of crevice corrosion were basically interferometric perturbations detected by the optical corrosion-meter only on the coated steel and the stainless steel samples in 1 M NaOH and 1M NaCl solutions, respectively. The interferometric perturbations interpreted as a localized corrosion underneath the coating in a form of an early crevice, of a depth ranged between 0.3 micrometers to several micrometers. Also, the early stage of crevice corrosion of the same alloys in same solutions was determined in situ by a modified electrochemical noise technique, called the modified electrochemical emission spectroscopy (MEES) technique, simultaneously during the optical interferometry measurements. Determinations of crevice corrosion by the MEES technique were electrochemical noise spectra detected on corrosion admittance (Ac)-time plots of the alloys in solutions. The corrosion admittance parameter, Ac equals (dJ/dV), which defined the MEES technique, is capable of indicating localized corrosion activities. In this investigation, the parameter Ac was modified in which that the change of the corrosion current density was measured by the optical corrosion-meter rather than by the zero resistance Ammeter, which is usually used for measuring the dJ in electrochemical noise technique. Consequently, result of the present work indicate that optical corrosion-meter as an electromagnetic method of measuring the corrosion current density, and MEES technique, as an electronic method for determining the Ac, are very useful techniques as non- destructive methods for detection of crevice corrosion at the initiation stage of the phenomenon.

Proceedings Article | 13 June 2001 Paper

Paper

Modified electrochemical emission spectroscopy (MEES) as NDT method of detection of SCC of metallic glasses

Khaled Habib

Proceedings Volume 4317, (2001) https://doi.org/10.1117/12.429592

KEYWORDS: Glasses, Corrosion, Nondestructive evaluation, Actinium, Human-computer interaction, Emission spectroscopy, Magnetism, Transformers, Annealing, Resistance

Read Abstract +

Proceedings Article | 16 June 2000 Open Access

Open Access

Paper

Optical interferometry techniques in electrochemistry education

Khaled Habib

Proceedings Volume 3831, (2000) https://doi.org/10.1117/12.388742

KEYWORDS: Transducers, Corrosion, Metals, Optical interferometry, Microscopes, Holographic interferometry, Capacitance, Holography, Hydrogen, Natural surfaces

Read Abstract +

Proceedings Article | 11 November 1999 Paper

Paper

Shearography as thermomechanical sensor for thermal stress determination of coatings at high temperatures

Khaled Habib

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369339

KEYWORDS: Shearography, Sensors, Nondestructive evaluation, Temperature metrology, Metals, Ceramics, Natural surfaces, Polymers, Epoxies, Carbon

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Proceedings Article | 19 July 1999 Paper

Paper

Interferometric spectroscopy as NDT technique for chemical analysis of different materials

Khaled Habib

Proceedings Volume 3749, (1999) https://doi.org/10.1117/12.354935

KEYWORDS: Corrosion, Spectroscopy, Nondestructive evaluation, Chemical analysis, Holographic interferometry, Interferometry, Metals, Materials science, Field spectroscopy, Chemical reactions

Proceedings Article | 29 September 1998 Paper

Paper

Optical interferometry techniques in electrochemistry and corrosion

Khaled Habib

Proceedings Volume 3407, (1998) https://doi.org/10.1117/12.323303

KEYWORDS: Corrosion, Polarization, Photography, Interferometry, Holographic interferometry, Metals, Optical interferometry, Electrodes, Mathematical modeling, Holography

Read Abstract +

Proceedings Article | 6 July 1998 Paper

Paper

Measurement of the electrical resistance of aluminum samples by holographic interferometry

Khaled Habib

Proceedings Volume 3479, (1998) https://doi.org/10.1117/12.316464

KEYWORDS: Resistance, Aluminum, Oxides, Holographic interferometry, Metals, Holography, Photography, Dielectric spectroscopy, Interferometry, Oxidation

Read Abstract +

Proceedings Article | 21 November 1997 Paper

Paper

Monitoring and measuring pitting corrosion of copper alloys by holographic interferometry

Khaled Habib

Proceedings Volume 3172, (1997) https://doi.org/10.1117/12.279738

KEYWORDS: Corrosion, Copper, Polarization, Holographic interferometry, Interferometry, Metals, Photography, Electrodes, Microscopes, Mathematical modeling

Read Abstract +

Proceedings Article | 20 March 1997 Paper

Paper

Corrosion measurement underneath coatings by holographic interferometry and other techniques

Khaled Habib, F. Al-Sabti

Proceedings Volume 2921, (1997) https://doi.org/10.1117/12.269806

KEYWORDS: Corrosion, Holographic interferometry, Dielectric spectroscopy, Optical coatings, Carbon, Polarization, Optical interferometry, Metals, Aluminum, Copper

Read Abstract +

Proceedings Article | 1 September 1996 Paper

Paper

Measurement of the double layer-capacitance of aluminium samples by holographic interferometry

K. Habib

Proceedings Volume 2778, 2778F6 (1996) https://doi.org/10.1117/12.2316235

Read Abstract +

Proceedings Article | 19 July 1996 Paper

Paper

Measurement of the ac impedance of aluminum samples by holographic interferometry

Khaled Habib

Proceedings Volume 2861, (1996) https://doi.org/10.1117/12.245172

KEYWORDS: Aluminum, Oxides, Holographic interferometry, Metals, Holography, Photography, Capacitance, Corrosion, Mathematical modeling, Oxidation

Read Abstract +

Proceedings Article | 1 September 1995 Paper

Paper

Boundary line of microcrystallines in amorphous and crystalline structures of metallic glasses

Khaled Habib

Proceedings Volume 2521, (1995) https://doi.org/10.1117/12.218358

KEYWORDS: Glasses, Microcrystalline materials, Transmission electron microscopy, Crystals, Diffraction, X-ray diffraction, Annealing, Crystallography, Magnetism, Heat treatments

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Proceedings Article | 27 July 1995 Paper

Paper

Optical corrosion meter

Khaled Habib, F. Al-Sabti, H. Al-Mazedi

Proceedings Volume 2577, (1995) https://doi.org/10.1117/12.215318

KEYWORDS: Corrosion, Aluminum, Metals, Carbon, Holography, Mathematical modeling, Holographic interferometry, Cameras, Electrodes, Holograms

Read Abstract +

Proceedings Article | 30 September 1994 Paper

Paper

Nondestructive evaluation of an epoxy-based coating by optical interferometry techniques

Khaled Habib

Proceedings Volume 2263, (1994) https://doi.org/10.1117/12.188010

KEYWORDS: Coating, Corrosion, Holographic interferometry, Metals, Mathematical modeling, Nondestructive evaluation, Optical interferometry, Holography, Carbon, Photography

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Proceedings Article | 1 March 1994 Paper

Paper

Initiation of stress corrosion cracking of Ti90-Al6-V4 wire in aqueous solution by holometry

Khaled Habib

Proceedings Volume 2004, (1994) https://doi.org/10.1117/12.172601

KEYWORDS: Corrosion, Holographic interferometry, Interferometry, Holography, Titanium, Resistance, Hydrogen, Electrodes, Mathematical modeling, Metals

Read Abstract +

Proceedings Article | 4 June 1993 Paper

Paper

Properties and structures of a magnetic shielding material

Khaled Habib, K. Moore, R. Nessler

Proceedings Volume 1855, (1993) https://doi.org/10.1117/12.146372

KEYWORDS: Magnetism, Crystals, Glasses, Surface roughness, Annealing, Transmission electron microscopy, Scanning tunneling microscopy, Diffraction, Crystallography, Scanning probe microscopy

Read Abstract +

Proceedings Article | 15 February 1993 Paper

Paper

Model of holographic interferometry of metal anodic dissolution in aqueous solution

Khaled Habib

Proceedings Volume 1756, (1993) https://doi.org/10.1117/12.140816

KEYWORDS: Metals, Mathematical modeling, Holographic interferometry, Electrodes, Corrosion, Data modeling, Interferometry, Aluminum, Sodium, Statistical modeling

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Proceedings Article | 1 July 1992 Paper

Paper

Properties and structures of Fe-based metallic thin films in amorphous and crystalline forms (Poster Paper)

Khaled Habib

Proceedings Volume 1678, (1992) https://doi.org/10.1117/12.60440

KEYWORDS: Glasses, Chromium, Crystals, Annealing, Surface roughness, Thin films, Magnetism, Transmission electron microscopy, Scanning tunneling microscopy, Transformers

Read Abstract +

Proceedings Article | 1 May 1992 Paper

Paper

Three-dimensional surface profile of Fe-based metallic thin films

Khaled Habib, Virgil Elings, C. Wu

Proceedings Volume 1639, (1992) https://doi.org/10.1117/12.58174

KEYWORDS: Annealing, Surface roughness, Thin films, Magnetism, Crystals, Transformers, Diffraction, Chromium, Scanning tunneling microscopy, Scanning probe microscopy

Read Abstract +

Proceedings Article | 1 January 1991 Paper

Paper

Holographic interferometry in corrosion studies of metals: II. Applications

Khaled Habib

Proceedings Volume 1332, (1991) https://doi.org/10.1117/12.51070

KEYWORDS: Corrosion, Holographic interferometry, Electrodes, Metals, Holography, Molybdenum, Mathematical modeling, Data modeling, Optical testing, Optical inspection

Read Abstract +

Proceedings Article | 1 January 1991 Paper

Paper

Holographic interferometry in corrosion studies of metals: I. Theoretical aspects

Khaled Habib

Proceedings Volume 1332, (1991) https://doi.org/10.1117/12.51069

KEYWORDS: Corrosion, Metals, Electrodes, Holographic interferometry, Optical testing, Optical inspection, Polarization, Resistance, Mathematical modeling, Nickel

Read Abstract +

Proceedings Article | 1 August 1990 Paper

Paper

Measuring surface roughness of an optical thin film with scanning tunneling microscopes

Khaled Habib, Virgil Eling, C. Wu

Proceedings Volume 1270, (1990) https://doi.org/10.1117/12.20373

KEYWORDS: Scanning tunneling microscopy, Thin films, Surface roughness, Mirrors, 3D image processing, Crystals, Glasses, X-ray diffraction, Scientific research, Metals

Read Abstract +

Proceedings Article | 1 July 1990 Paper

Paper

Holographic interferometry in predicting cathodic deposition of metals in aqueous solution

K. Habib

Proceedings Volume 1230, 12302Z (1990) https://doi.org/10.1117/12.2294744

Read Abstract +

Proceedings Article | 1 July 1990 Paper

Paper

Holographic interferometry in electrochemical systems

Khaled Habib

Proceedings Volume 1319, (1990) https://doi.org/10.1117/12.22171

Read Abstract +

Proceedings Article | 1 July 1990 Paper

Paper

Technique for measuring the surface roughness of metallic electrodes in aqueous solution

Khaled Habib

Proceedings Volume 1319, (1990) https://doi.org/10.1117/12.34859

Read Abstract +

Proceedings Article | 1 May 1990 Paper

Paper

Novel technique for measuring the mechanochemical anodic dissolution of metallic electrodes in aqueous solutions

Khaled Habib, Gary Carmichael, Roderic Lakes, William Stwalley

Proceedings Volume 1212, (1990) https://doi.org/10.1117/12.18003

KEYWORDS: Corrosion, Electrodes, Holographic interferometry, Holography, Molybdenum, Metals, Holograms, Scanning electron microscopy, Chemical reactions, Interfaces

Read Abstract +

Showing 5 of 47 publications

Conference Committee Involvement (87)

The 8th Annual International Conference on Sensors and Electronic Instrumentation Advances (SEIA' 2022), a member of the International Program Committee

21 September 2022 |

The 11th Spring World Congress on Engineering and Technology (SCET 2022) , A member of Technical Program committee(TPC)

19 April 2022 |

ICAMEM2022, A member of technical program committee

29 March 2022 |

The International Conference on Technological Innovation and Social Governance(TISG2021), a member of the technical program committee

19 September 2021 |

19th International Conference on Emerging Materials and Nanotechnology, a member of the organizing committee

8 September 2021 |

Applied Optical Metrology IV

4 August 2021 | San Diego, California, United States

The Fifth International Conference on Energy Engineering and Environmental Protection (EEEP2020) , a member of the technical program committee

17 November 2020 |

Sixth International Conference on Sensors and Electronic Instrumentation Advances (SEIA' 2020), A member ofInternational Program Committee

23 September 2020 |

The 2020 3rd International Conference on Energy and Power Engineering (EPE2020), A member of Technical Program Committee

20 September 2020 |

The 9th Spring International Conf. on Material Sciences and Technology (MST-S), A member of Technical Program Committee

14 August 2020 |

18th International Conference on Emerging Materials and Nanotechnology, A member of technical program committee

26 July 2020 |

International Conference and Exhibition onPure and Applied Chemistry, A member of the organizing committee

20 July 2020 |

ARK Global Summit and Expo on Lasers, Optics and Photonics, a member of the scientific committee

16 July 2020 |

3rd World Conference on Analytical & Bio-analytical Chemistry, A member of the organizing committee

16 July 2020 |

2020 9th International Conference on Advanced Materials and Engineering Materials, a member Technical program committee

3 July 2020 |

International conference and expo on Atomic Molecular and Optical Physics, A member of Technical program committee

18 June 2020 |

15th International Conference on Materials Chemistry & Science, a member of the organizing committee

27 May 2020 |

2020 8th International Conference on Metallurgy Technology and Materials, a member of echnical rogram committee

25 April 2020 |

2020 WORLD SUMMIT ON MATERIALS SCIENCE AND NANOTECHNOLOGY, A member of Advisory Team

26 March 2020 |

The 6th Int’l Conference on Surface and Interface of Materials (SIM-BT 2019), A keynote speaker

13 December 2019 |

The Fourth International Conference on Energy Engineering and Environmental protection, A member of the organizing coommittee

19 November 2019 |

Fifth International Conference on Sensors and Electronic Instrumentation Advances (SEIA' 2019),International Program Committee Member

25 September 2019 |

The 8th Spring World Congress on Engineering and Technology (SCET 2019) , A member of Technical Program committee

22 August 2019 |

The 12th International Symposium on Photonics and Optoelectronics (SOPO 2019), a member of Technical Program Committee(TPC)

17 August 2019 |

The 12th International Symposium on Photonics and Optoelectronics (SOPO 2019), a member of technical program committee

17 August 2019 |

Applied Optical Metrology III

13 August 2019 | San Diego, California, United States

OSCINE NEST-Conference on Molecular Physics, A member of the international advisory committe

17 June 2019 |

The 8th Spring World Congress on Engineering and Technology (SCET 2019), A member of technical program committee

22 April 2019 |

The 2019 3rd International Workshop on >Education, Big Data and Information Technology, A regional Chairman

25 March 2019 |

2nd International Conference and Expo on Condensed Matter Physics, A member of the organizing committee

15 October 2018 |

Optics Education and Outreach V

22 August 2018 | San Diego, California, United States

The 11th International Symposium on Photonics and Optoelectronics (SOPO 2018), a member of technical program committee

18 August 2018 |

The 4th Int'l Conference on Physical Chemistry (CPC 2018), an Invited Speaker

14 July 2018 |

The EMN Meeting on Mesoporous Materials/Magnetic Nanomaterials, A member of program technical committee

9 July 2018 |

The 7th Spring World congress on Engineering Technology, a member of the technical program committee

23 April 2018 |

Dimensional Optical Metrology and Inspection for Practical Applications VII

18 April 2018 | Orlando, FL, United States

Advanced Energy Materials & Technology Congress, A conference committee member

25 March 2018 |

3rd International Conference on Sensors, A member of International Program Committee

20 September 2017 |

3rd International Conference on Sensors and Electronic Instrumentation Advances(SEIA' 2017), A member of internation program committee

20 September 2017 |

The 10th International Symposium on Photonics and Optoelectronics (SOPO 2017) , A member of technical program committee

18 August 2017 |

EMN Meeting on Metallic Glasses, A member of International Program Committee.

7 August 2017 |

The 14th International Conference on ETOP 2017, A session Chairman & an invited speaker

29 May 2017 |

Frontier Forum on Nanoscience, A commttee member

4 May 2017 |

2017 the 6th Spring World Congress on Engineering and Technology (SCET 2017) . A member of technical program committee

18 April 2017 |

Dimensional Optical Metrology and Inspection for Practical Applications VI

13 April 2017 | Anaheim, CA, United States

Dimensional Optical Metrology and Inspection for Practical Applications VI,A member of the Technical Program Committee(TPC)

9 April 2017 |

The 2017 2nd International Conference on Environmental Science and Energy Engineering(ICESEE2017), A member of the technical program committee

15 January 2017 |

International Conference on Nanomaterials, Functional and Composite Materials, A member of the International Conference Programme Committee

7 January 2017 |

The 3rd Int'l Conference on Polymer Materials Science (PMS 2017), A member of Technical Program Committee

3 January 2017 |

2016 International Conference on Applied Science and Technlogy(ICAST2016), A member of the international technical committee

24 December 2016 |

Optics Education and Outreach IV

31 August 2016 | San Diego, California, United States

The International Symposium on Photonics and Optoelectronics (SOPO 2016), Technical Program Committee (TPC) Co-Chair

26 August 2016 |

The First International Conference on Advances in Sensors, Actuators, Metering and Sensing ( ALLSENSORS 2016), A member of Technical Program Committee

24 April 2016 |

Dimensional Optical Metrology and Inspection for Practical Applications V

20 April 2016 | Baltimore, MD, United States

Dimensional Optical Metrology and Inspection for Practical Applications V, A member of the Program Committee

17 April 2016 |

2016 Spring World Congress on Engineering and Technology (SCET 2016), A member of Technical Program Committee (TPC)

17 April 2016 |

The 2nd Int'l Conference on Polymer Materials Science (PMS 2016), An invited speaker and a chairman of a session.

14 January 2016 |

International Conference on Sensors Engineering and Electronics Instrumental Advances, In conjunction with: 1st International Workshop on Recent Advances on Electrical, Sensors and Transducers Equipments , A member of the International Program Committee

22 November 2015 |

International Conference on Materials Chemistry and Environmental Protection (MEEP 2015), A member of the Technical Program Committee

21 November 2015 |

The International Symposium on Photonics and Optoelectronics (SOPO 2015), Technical Program Committee (TPC) Co-Chair

22 August 2015 |

Well Integrity Conference, an invited speaker

26 April 2015 |

The 2015 EMN Optoelectronics on Energy Materials and Nanotechnology, A member of International program committee

24 April 2015 |

Dimensional Optical Metrology and Inspection for Practical Applications IV

20 April 2015 | Baltimore, MD, United States

International Conference on Optical and Photonic Engineering(icOPEN2015),a symposium chairman

16 April 2015 |

The 10th Annual Assessment Integrity Management Summit, An invited speaker

1 March 2015 |

Maitenance Kuwait Summit, an invited lecturer

4 February 2015 |

2015 International Conference on Intelligent Materials and Manufacturing Engineering(IMME2015), a member of Technical Program Committee(TPC)

16 January 2015 |

The 2014 4th International Conference on Energy, Environment and Sustainable Development (ICEESD2014)

25 October 2014 |

3rd International Conference on Optical, Electronic, and Electrical Materials, a Member of the technical Committee

11 October 2014 |

8th Corrosion Management Summit,an invited speaker

15 September 2014 |

International Symposium on Photonics and Optoelectronics 2014

22 August 2014 | Suzhou, China

The International Symposium on Photonics and Optoelectronics (SOPO2014),22-24 August 2014,Sushou, China, Technical Program Committee (TPC) Co-Chair

22 August 2014 |

Dimensional Optical Metrology and Inspection for Practical Applications III

5 May 2014 | Baltimore, MD, United States

Kuwait Corrosion Management Conference & Exhibition, an invited lecturer

18 December 2013 |

Dimensional Optical Metrology and Inspection for Practical Applications II

25 August 2013 | San Diego, California, United States

A member of the organization committee of "Optical Metrology and Inspection for Industrial Applications II"Part of the SPIE/COS International Symposium on Photonics Asia

7 November 2012 |

Optical Metrology and Inspection for Industrial Applications II

5 November 2012 | Beijing, China

A member of the international scientific committee and a chairman of a session at Diffusion in Solids and Liquids 2008

9 July 2008 |

An invited lecturer and Chairman of a technical session at the Beijing International Materials Week (2006 BIMW)

24 June 2006 |

An invited lecturer and a chairman of a technical session at the 1st International Conference on Advanced Non-Destructive Evaluation

7 November 2005 |

A plenary lecturer and a chairman of a session at the LATINCORR’2003 CONFERENCE

18 October 2004 |

A plenary lecturer at the 7th Corrosion Congress

19 August 2003 |

An invited lecturer at National Convention on Corrosion (CORCON) .

28 November 2002 |

International Conference on Applied Optical Metrology, A session Chairman& an invited speaker

8 June 1998 |

An invited lecturer & panelist at the 15th World Petroleum Congress

12 October 1997 |

A chairman of a technical session at the 2nd Arabian Corrosion Conference,INDUSTRIAL CORROSION AND CORROSION CONTROL TECHNOLOGY

12 October 1996 |

An invited lecturer & a chairman of a technical session at Fatigue 90 – The 4th International Fatigue Conference

15 July 1990 |

Showing 5 of 87 Conference Committees

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