In digital imaging systems, using anti-scatter grids may lead to arise moire artifacts. Recently, amorphous seleniumbased
(direct-conversion) flat panel X-ray detector systems were developed. An important advantage of a-Se is its high
spatial resolution. However, the high resolution of a-Se potentially introduces more moire artifacts.1 The aim of present
study was to choice optimal anti-scatter grids in amorphous selenium-based flat panel X-ray system, and to demonstrate
how to arise moire artifacts. We simulated the sampling process in the spatial domain equivalent to the sampling aperture
function in the spatial frequency domain. Moire patterns appeared with the different period and contrast. The period and
the contrast of moire artifacts were varied with combinations of the sampling conditions and the strip density of antiscatter
grids.
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