Dr. Leonid Khriachtchev
at Aalto Univ School of Science and Technology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 22 May 2007 Paper
Leonid Khriachtchev, Markku Räsänen, Sergei Novikov
Proceedings Volume 6591, 65910D (2007) https://doi.org/10.1117/12.722135
KEYWORDS: Silicon, Raman spectroscopy, Silica, Annealing, Semiconductor lasers, Crystals, Temperature metrology, Thermal effects, Absorption, Interfaces

Proceedings Article | 20 April 2006 Paper
S. Novikov, J. Sinkkonen, L. Khriachtchev, M. Räsänen, A. Sitnikova
Proceedings Volume 6195, 619512 (2006) https://doi.org/10.1117/12.661849
KEYWORDS: Stereolithography, Silicon, Superlattices, Annealing, Raman spectroscopy, Luminescence, Etching, Transmission electron microscopy, Refractive index, High temperature raman spectroscopy

Proceedings Article | 7 July 2005 Paper
Proceedings Volume 5840, (2005) https://doi.org/10.1117/12.608280
KEYWORDS: Raman spectroscopy, Silicon, Silica, Annealing, Absorption, Crystals, Laser crystals, Nanocrystals, High temperature raman spectroscopy, Temperature metrology

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