Nano surfaces offer exciting opportunities to implement novel technologies. With their help, surfaces can be created that are very suitable as a reflection-absorbing layer. In order to be able to determine the degree of reflection and to compare it with the current methods of anti-reflection coating, a measuring system was developed which can measure the degree of reflection hemispherically. Furthermore, a simulation model was developed with which the behavior of the nano-surfaces can be examined with different parameters.
Nano surfaces offer exciting opportunities to implement novel technologies. The effort involved in producing these surfaces is particularly high in terms of the required quality. At the same time, meeting these high standards is often difficult, as it presents the necessary measurement technology with special challenges. In this paper, several measurement methods are shown in order to examine and compare new types of nano-surfaces for contacting for their quality, not only in nano-scale but in large-scale without the need of high resolution methods as SEM.
Optical spatial frequency (correlation) filtering techniques identify a class of noncontact vectorial velocity sensors. Detectors according to this optical measuring method are characterized by a fast measurement with a small dead time and low measurement uncertainty. For the purpose of measurement, the sensors determine the relative displacement of any randomly structured surface with respect to the sensor. The use of newer filter structures can reduce the measurement uncertainty.
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