A better understanding of structural properties and growth kinetics of Stranski-Krastanov (SK) quantum dots is
necessary for applying dot potential in optical and electronic applications. In fact, We have recently demonstrated
theoretically and experimentally, the ability of reflection high energy electron diffraction (RHEED) tool in quantitative
analysis such as extracting average dot size, facet orientation and average dot density and real time monitoring of dot
size during growth .As an extended study, in this work for the first time we present the experimental evidence on onset epitaxial quantum dot average shape evolution and theoretical predictions on QD facet orientations.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.