Dr. Mario A. P. Vaz
at Univ do Porto
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 18 November 2013 Paper
Proceedings Volume 8785, 8785BI (2013) https://doi.org/10.1117/12.2027576
KEYWORDS: Fringe analysis, Fourier transforms, Resolution enhancement technologies, Image filtering, Optical metrology, Image processing, Mechanical engineering, Shape analysis, Defect detection, Shearography

Proceedings Article | 11 September 2012 Paper
Cássia Corrêa, Nuno Ramos, Jaime Monteiro, Luis Vaz, Mario A. Vaz
Proceedings Volume 8413, 84131C (2012) https://doi.org/10.1117/12.978232
KEYWORDS: Ions, Interferometry, Speckle pattern, Bone, Teeth, Tissues, Dentistry, Phase interferometry, Surgery, Experimental mechanics

SPIE Journal Paper | 6 April 2012
Jose Xavier, António Sousa, Jose Morais, Vitor Filipe, Mario Vaz
OE, Vol. 51, Issue 4, 043602, (April 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.4.043602
KEYWORDS: Digital image correlation, Image processing, Optical engineering, Optical flow, Speckle pattern, Epoxies, Spatial resolution, Interferometry, Speckle, Digital image processing

SPIE Journal Paper | 1 October 2007
OE, Vol. 46, Issue 10, 107205, (October 2007) https://doi.org/10.1117/12.10.1117/1.2790926
KEYWORDS: Calibration, Cameras, Corner detection, Ridge detection, Sensors, Image processing, Optical engineering, Chromium, Target detection, Optimization (mathematics)

Proceedings Article | 18 June 2007 Paper
Paulo Tavares, Nuno Viriato, Jorge Reis, Mário Vaz
Proceedings Volume 6616, 66160X (2007) https://doi.org/10.1117/12.726031
KEYWORDS: Projection systems, 3D image processing, 3D metrology, Light sources and illumination, Crystals, GRIN lenses, Calibration, Phase measurement, LCDs, Semiconductor lasers

Showing 5 of 6 publications
Conference Committee Involvement (1)
International Conference on Applications of Optics and Photonics
3 May 2011 | Braga, Portugal
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